Compact electron beam ion sources/traps: Review and prospects (invited)

Zschornack, G.; Kreller, M.; Ovsyannikov, V. P.; Grossman, F.; Kentsch, Ulrich; Schmidt, M.; Ullmann, F.; Heller, R.

doi:10.1063/1.2804901

Cited by 42 publications

(29 citation statements)

References 18 publications

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“…This implicates that the interaction of particles with ultra-thin solid targets may not be described in terms of an "average interaction per unit length". Highly charged ions are produced in a room-temperature electron beam ion trap (EBIT) [34] at the Ion Beam Center of the Helmholtz-Zentrum Dresden-Rossendorf. Xe ion charge states from Q = 10 -30 are selected utilizing an analyzing magnet.…”

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confidence: 99%

Charge Exchange and Energy Loss of Slow Highly Charged Ions in 1 nm Thick Carbon Nanomembranes

et al. 2014

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Experimental charge exchange and energy loss data for the transmission of slow highly charged Xe ions through ultra-thin polymeric carbon membranes are presented. Surprisingly, two distinct exit charge state distributions accompanied by charge exchange dependent energy losses are observed. The energy loss for ions exhibiting large charge loss shows a quadratic dependency on the incident charge state indicating that equilibrium stopping force values do not apply in this case. Additional angle resolved transmission measurements point on a significant contribution of elastic energy loss. The observations show that regimes of different impact parameters can be separated and thus a particle's energy deposition in an ultra-thin solid target may not be described in terms of an averaged energy loss per unit length. Modern approaches in ion and electron irradiation of solids such as nano-structuring of thin films or even structuring of free-standing monolayers such as graphene [1][2][3] or MoS 2 [4, 5] rely on models for structural and electronic defect formation. Most important for processes during ion-solid interaction is the amount of deposited energy and its dissipation channels [6]. We show that the energy loss and charge exchange of ions in very thin films, such as 2D-materials, show significant differences to solids with reduced thickness. The understanding of these differences is not only of importance for ion beam analysis of 2D-materials but in particular for manipulating and tailoring their properties. [7]. To probe interaction processes in very thin target materials slow highly charged ions (HCI) are ideal tools due to their energy deposition confinement to shallow surface regions. Besides the well known near-surface potential energy deposition [8,9] also an expected increased pre-equilibrium kinetic energy loss (stopping force) [10] is confined to a few nm at the surface. In the conventional description of both contributions to the stopping force, i.e. nuclear and electronic stopping, the charge state of an ion is identified with its equilibrium charge state by Bohr's stripping criterion [11,12]. The equilibrium charge state by Bohr is given as Q eq = Z 1/3 v/v 0 and describes the (average) charge state of an ion passing through a solid at a given velocity v (v 0 : Bohr's velocity, Z: nuclear charge of the ion). The charge state Q of slow highly charged ions is much higher than the equilibrium charge state Q eq (Q eq Q < ∼ Z). Therefore, the interaction of HCI with surfaces may not be described in terms of an equilibrium charge state dependent stopping force. Furthermore, due to the localization of the energy deposition slow HCI can be used as an efficient tool for surface nano-structuring [13][14][15][16][17][18][19][20][21][22][23][24] and tuning of the electrical properties of materials [25], as well as a probe for surface energy deposition processes [26,27]. Recently, it has been shown that slow HCI can create pores in 1 nm thick carbon nanomembranes (CNM) [28,29] mainly by deposition of their potential ...

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confidence: 99%

Charge Exchange and Energy Loss of Slow Highly Charged Ions in 1 nm Thick Carbon Nanomembranes

et al. 2014

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“…Multicharged ions are mainly generated by electron cyclotron resonance ion sources (ECRIS), 4,5 electron beam ion sources (EBIS), 6,7 and laser multicharged ion (LMCI) sources. 8,9 ECRIS and EBIS operate only with gases and, therefore, for elements with low vapor pressures, they require introducing gaseous compounds or some vaporization mechanism.…”

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confidence: 99%

Spark discharge coupled laser multicharged ion source

Shaim

Elsayed-Ali

2015

Review of Scientific Instruments

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A spark discharge is coupled to a laser multicharged ion source to enhance ion generation. The laser plasma triggers a spark discharge with electrodes located in front of the ablated target. For an aluminum target, the spark discharge results in significant enhancement in the generation of multicharged ions along with higher charge states than observed with the laser source alone. When a Nd:YAG laser pulse (wavelength 1064 nm, pulse width 7.4 ns, pulse energy 72 mJ, laser spot area on target 0.0024 cm(2)) is used, the total multicharged ions detected by a Faraday cup is 1.0 nC with charge state up to Al(3+). When the spark amplification stage is used (0.1 μF capacitor charged to 5.0 kV), the total charge measured increases by a factor of ∼9 with up to Al(6+) charge observed. Using laser pulse energy of 45 mJ, charge amplification by a factor of ∼13 was observed for a capacitor voltage of 4.5 kV. The spark discharge increases the multicharged ion generation without increasing target ablation, which solely results from the laser pulse. This allows for increased multicharged ion generation with relatively low laser energy pulses and less damage to the surface of the target.

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“…In contrast to most other existing EBIS/T systems, it uses permanent magnets instead of superconducting coils for the compression of the electron beam, which results in minimal infrastructural requirements, simple handling, and stable operation. 17 In general, this EBIT is loaded with gases fed through a needle valve injection system. This only allows a limited selection of elements to be used for ion production.…”

Section: Introductionmentioning

confidence: 99%

Demonstration of charge breeding in a compact room temperature electron beam ion trap

Vorobjev

Соколов

Thorn

et al. 2012

Review of Scientific Instruments

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For the first time, a small room-temperature electron beam ion trap (EBIT), operated with permanent magnets, was successfully used for charge breeding experiments. The relatively low magnetic field of this EBIT does not contribute to the capture of the ions; single-charged ions are only caught by the space charge potential of the electron beam. An over-barrier injection method was used to fill the EBIT's electrostatic trap with externally produced, single-charged potassium ions. Charge states as high as K(19+) were reached after about a 3 s breeding time. The capture and breeding efficiencies up to 0.016(4)% for K(17+) have been measured.

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Compact electron beam ion sources/traps: Review and prospects (invited)

Cited by 42 publications

References 18 publications

Charge Exchange and Energy Loss of Slow Highly Charged Ions in 1 nm Thick Carbon Nanomembranes

Charge Exchange and Energy Loss of Slow Highly Charged Ions in 1 nm Thick Carbon Nanomembranes

Spark discharge coupled laser multicharged ion source

Demonstration of charge breeding in a compact room temperature electron beam ion trap

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