Compact description of substrate-related aberrations in high numerical-aperture optical disk readout

Stallinga, Sjoerd

doi:10.1364/ao.44.000849

Cited by 32 publications

(22 citation statements)

References 10 publications

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“…For λ = 500 nm, NA ob = 1.25, and n med = 1.33 it can be estimated with the methods of ref. [26] that this amount of defocus corresponds to a change in focal position in the medium of about 150 nm. The asymmetry effect is quite pronounced with a shift in the spot peak of about 0.16λ /NA ob ≈ 64 nm.…”

Section: The Effect Of Aberrations and Dipole Orientation On Spot Shamentioning

confidence: 99%

Accuracy of the Gaussian Point Spread Function model in 2D localization microscopy

Stallinga¹,

Rieger²

2010

Opt. Express

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Abstract:The Gaussian function is simple and easy to implement as Point Spread Function (PSF) model for fitting the position of fluorescent emitters in localization microscopy. Despite its attractiveness the appropriateness of the Gaussian is questionable as it is not based on the laws of optics. Here we study the effect of emission dipole orientation in conjunction with optical aberrations on the localization accuracy of position estimators based on a Gaussian model PSF. Simulated image spots, calculated with all effects of high numerical aperture, interfaces between media, polarization, dipole orientation and aberrations taken into account, were fitted with a Gaussian PSF based Maximum Likelihood Estimator. For freely rotating dipole emitters it is found that the Gaussian works fine. The same, theoretically optimum, localization accuracy is found as if the true PSF were a Gaussian, even for aberrations within the usual tolerance limit of high-end optical imaging systems such as microscopes (Marechal's diffraction limit). For emitters with a fixed dipole orientation this is not the case. Localization errors are found that reach up to 40 nm for typical system parameters and aberration levels at the diffraction limit. These are systematic errors that are independent of the total photon count in the image. The Gaussian function is therefore inappropriate, and more sophisticated PSF models are a practical necessity.

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Section: The Effect Of Aberrations and Dipole Orientation On Spot Shamentioning

confidence: 99%

Accuracy of the Gaussian Point Spread Function model in 2D localization microscopy

Stallinga¹,

Rieger²

2010

Opt. Express

Self Cite

200

163

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“…If we remove the disk, the wavefront contains rotationally symmetric aberrations such as defocus and spherical aberration are induced by the cover layer because the SIL optical head is designed to compensate these aberrations. The Zernike coefficients of the rotationally symmetric aberrations are defined (Stallinga 2005) as…”

Section: Sil Optical Headmentioning

confidence: 99%

Assembly and evaluation of a SIL optical head for cover-layered incident NFR without disk contact with the bottom surface of a SIL

et al. 2009

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In the assembly of the solid immersion lens (SIL) optical head for cover-layered incident near-field recordings (NFRs), disk contact with the bottom surface of the SIL has previously been regarded as essential. This is because SIL optical heads are designed to interface with a cover layer. However, SILs can be contaminated and damaged by this contact. We present a new SIL optical head assembly method for cover-layered incident NFRs without disk contact with the bottom surface of the SIL. To achieve this, we added zoom optics to a Twyman-Green interferometer in the measurement beam optical path. Our assembly method eliminates SIL contamination problems and the assembly procedure becomes simple because of removing the disk contact process. In addition, it is not necessary to consider the aberrations induced by disk tilt and cover-layer thickness variation. The SIL optical head assembled by the proposed method has good optical performance satisfying the optical tolerances and the measured wavefront aberration is good agreement with simulations.

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“…At , the beam is transmitted through an abrupt transition to a semi-infinite second medium with refractive index that leads to a focal shift . To find the optimal focal position, we will use the Stallinga's theory for maximum diffraction efficiency and beam quality/minimum SA and micrograting size [16]. Figure 4 shows the spatial refractive index modulation of a micrograting induced by the interference of two focused counter-propagating beams using vector diffraction theory.…”

Section: Introductionmentioning

confidence: 99%

Diffraction Focal Position and Vector Diffraction Theory for Micro Holographic Storage Systems

et al. 2014

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Abstract:In this study, we proposed a method to determine the optimal focal position for micro-holographic storage systems, using vector diffraction theory; the theory provides exact solutions when the numerical aperture (NA) exceeds 0.6. The best diffraction focus was determined by the position and wavelength corresponding to minimal spherical aberration. The calculated refractive index modulation, polarization illumination, and boundary conditions at the interface of different media were analyzed. From the results of our analysis, we could confirm the size of micrograting as a function of NA and wavelength, based on vector diffraction theory, compared with scalar diffraction theory which defines the micrograting by . To demonstrate our analysis, we adapted an optical alignment method using a Twyman-Green interferometer, and could obtain good agreement between analysis and experimental results.

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Compact description of substrate-related aberrations in high numerical-aperture optical disk readout

Cited by 32 publications

References 10 publications

Accuracy of the Gaussian Point Spread Function model in 2D localization microscopy

Accuracy of the Gaussian Point Spread Function model in 2D localization microscopy

Assembly and evaluation of a SIL optical head for cover-layered incident NFR without disk contact with the bottom surface of a SIL

Diffraction Focal Position and Vector Diffraction Theory for Micro Holographic Storage Systems

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