Combining scanning tunneling microscopy and synchrotron radiation for high-resolution imaging and spectroscopy with chemical, electronic, and magnetic contrast

Combined scanning probe microscopy and x-ray scattering instrument for in situ catalysis investigations

“…AFM and STM are used in combination with synchrotron radiation for combined imaging and spectroscopy. [16][17][18][19][20][21][22][23][24][25] The SPM-X-ray combination presented here, integrated with a UHV chamber and a gas flow reactor, enables the application of this combination of techniques to the field of heterogeneous catalysis.…”

Spin-dependent synchrotron x-ray excitations studied by scanning tunneling microscopy

“…So far, there have been several efforts focused on the combination of scanning probe microscopy and synchrotron radiation. [3][4][5][6][7][8][9][10] In synchrotron x-ray scanning tunneling microscopy (SXSTM), absorption of photons by a sample can cause electrons that are excited to unoccupied levels close to Fermi energy, 10 and photoelectrons that are ejected from the sample surface. 11,12 A conducting tip that is tunneling over a sample surface (near field) can locally measure these excited electrons.…”

“…16 A detailed description of the SXSTM apparatus can be found elsewhere. 10 A patterned structure of 20-nm-thick connected NiFe rings was fabricated on a Si(001) wafer by means of electron-beam evaporation and lift-off. An insulator-coated Pt 90 Ir 10 tip has been prepared by a combination of electron beam physical vapor deposition and focused ion beam milling.…”

X-ray nanotomography of SiO2-coated Pt90Ir10tips with sub-micron conducting apex

“…The prospects of the combination of scanning probes with synchrotron radiation has led to substantial efforts at synchrotron facilities worldwide. [6][7][8][9][10][11][12][13] Generally, the spatial resolution in STM depends on the sharpness of the tip. 14 However, in SXSTM, in addition to tunneling current, x-ray photoabsorption can yield extra electrons that are ejected from the sample and collected at the tip.…”

“…So far several techniques and coatings have been utilized for the purpose of developing and fabricating "smart" tips. 13,[16][17][18][19] Our experiments were performed at the Hard X-ray Nanoprobe (HXN) beamline, jointly operated by the Advanced Photon Source and the Center for Nanoscale Materials, at Argonne National Laboratory. The HXN can obtain tomographic images with 30 nm voxel resolution.…”