A dedicated high-resolution high-throughput X-ray powder diffraction beamline has been constructed at the Advanced Photon Source (APS). In order to achieve the goals of both high resolution and high throughput in a powder instrument, a multi-analyzer detector system is required. The design and performance of the 12-analyzer detector system installed on the powder diffractometer at the 11-BM beamline of APS are presented.
Motivated by the advanced photon source upgrade, a new hard X-ray microscope called “Velociprobe” has been recently designed and built for fast ptychographic imaging with high spatial resolution. We are addressing the challenges of high-resolution and fast scanning with novel hardware designs, advanced motion controls, and new data acquisition strategies, including the use of high-bandwidth interferometric measurements. The use of granite, air-bearing-supported stages provides the necessary long travel ranges for coarse motion to accommodate real samples and variable energy operation while remaining highly stable during fine scanning. Scanning the low-mass zone plate enables high-speed and high-precision motion of the probe over the sample. With an advanced control algorithm implemented in a closed-loop feedback system, the setup achieves a position resolution (3σ) of 2 nm. The instrument performance is evaluated by 2D fly-scan ptychography with our developed data acquisition strategies. A spatial resolution of 8.8 nm has been demonstrated on a Au test sample with a detector continuous frame rate of 200 Hz. Using a higher flux X-ray source provided by double-multilayer monochromator, we achieve 10 nm resolution for an integrated circuit sample in an ultrafast scan with a detector’s full continuous frame rate of 3000 Hz (0.33 ms per exposure), resulting in an outstanding imaging rate of 9 × 104 resolution elements per second.
The combination of the high spatial resolution of scanning tunneling microscopy with the chemical and magnetic contrast provided by synchrotron X-rays has the potential to allow a unique characterization of advanced functional materials. While the scanning probe provides the high spatial resolution, synchrotron X-rays that produce photo-excitations of core electrons add chemical and magnetic contrast. However, in order to realize the method's full potential it is essential to maintain tunneling conditions, even while high brilliance X-rays irradiate the sample surface. Different from conventional scanning tunneling microscopy, X-rays can cause a transition of the tip out of the tunneling regime. Monitoring the reaction of the z -piezo (the element that controls the tip to sample separation) alone is not suffi cient, because a continuous tip current is obtained. As a solution, an unambiguous and direct way of fi ngerprinting such near to far fi eld transitions of the tip that relies on the simultaneous analysis of the X-ray-induced tip and sample current is presented. This result is of considerable importance because it opens the path to the ultimate resolution in X-ray enhanced scanning tunneling microscopy.
In this paper, a new model of the harmonic drive transmission is presented. The purpose of this work is to better understand the transmission hysteresis behavior while constructing a new type of comprehensive harmonic drive model. The four dominant aspects of harmonic drive behavior—nonlinear viscous friction, nonlinear stiffness, hysteresis, and kinematic error—are all included in the model. The harmonic drive is taken to be a black box, and a dynamometer is used to observe the input/output relations of the transmission. This phenomenological approach does not require any specific knowledge of the internal kinematics. In a novel application, the Maxwell resistive-capacitor hysteresis model is applied to the harmonic drive. In this model, sets of linear stiffness elements in series with Coulomb friction elements are arranged in parallel to capture the hysteresis behavior of the transmission. The causal hysteresis model is combined with nonlinear viscous friction and spectral kinematic error models to accurately represent the harmonic drive behavior. Empirical measurements are presented to quantify all four aspects of the transmission behavior. These measurements motivate the formulation of the complete model. Simulation results are then compared to additional measurements of the harmonic drive performance.
The design and performance of a novel ultra-high-vacuum-compatible artificial channel-cut monochromator that has been commissioned at undulator beamline 8-ID-I at the Advanced Photon Source are presented. Details of the mechanical and optical design, control system implementation and performance of the new device are given. The monochromator was designed to meet the challenging stability and optical requirements of the X-ray photon correlation spectroscopy program hosted at this beamline. In particular, the device incorporates a novel in-vacuum sine-bar drive mechanism for the combined pitch motion of the two crystals and a flexure-based high-stiffness weak-link mechanism for fine-tuning the pitch and roll of the second crystal relative to the first crystal. The monochromator delivers an exceptionally uniform and stable beam and thereby improved brilliance preservation.
A high‐resolution and high‐throughput synchrotron powder diffractometer has been automated for use with samples that are mailed in by Advanced Photon Source users. Implementation of a relational database with web interfaces for both outside users and beamline staff, which is integrated into the facility‐wide proposal and safety system, allows all aspects of beamline management to be integrated. This system permits users to request kits for mounting samples, to provide sample safety information, to obtain their collected data and to provide usage information upon project completion in a quick and simple manner. Beamline staff use a separate interface to note receipt of samples, schedule and collect diffraction data, post‐process and quality‐check data, and dispose of samples. The design of the software and database are discussed in detail.
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