Combined texture and microstructure analysis of deformed crystals by high-energy X-ray diffraction

Abstract

It is shown that high‐energy X‐ray diffraction allows a fast and accurate texture and microstructure analysis of crystals, which can help to set up optimal industrial procedures for materials manufacturing. This paper presents the experimental and theoretical aspects of quantitative texture analysis using high‐energy synchrotron beams. Intensity corrections are less important in this approach than in classical laboratory methods; however, the most important correction, related to the Lorentz factor, can introduce relative fraction changes of up to about 40% compared to the uncorrected case. The resolution of the orientation density function also influences the results. For example, the usual 5° resolution leads to relative deviations of up to 30% in the fraction of some components. The method allowed detection of small changes taking place during the recovery and continuous recrystallization of a cold‐rolled Al–TiB2 nanocomposite. Texture information was combined with the results of line profile analysis, evidencing the evolution of the average dislocation density and coherent domain size of the selected grain families. It was found that recovery, as described in terms of dislocation annihilation and coherent domain coarsening, takes place at similar rates in all components.

Multiscale Exploration of Texture and Microstructure Development in Recrystallization Annealing of Heavily Deformed Ferritic Alloys

“…The ω-averaged images were further divided to 5 • slices in azimuthal direction, η, and subjected to 1D azimuthal integration with pyFAI software. The resulting polar intensity distributions were corrected for Lorentz and polarization factors [9,15]. These distributions were used to derive pole figures (PFs) and orientation distribution functions IOP Publishing doi:10.1088/1757-899X/1249/1/012044 3 (ODFs) using MTEX software [16].…”

“…Although at high deformation levels grain indexing is not possible, a quantitative texture analysis can still be carried out using the observed intensities from Debye-Scherrer rings. It has been shown that XRD is a well-suited tool for non-destructive texture characterization [9,10]. Combining synchrotron XRD (SXRD) texture information with DFXM data provides not only a volumeaveraged understanding of the sample, but also the fine details of the intricate physics of a grain of interest (GOI) in micro scale within bulk.…”

Elastic strain tensor of zirconium hydrides in Zr2.5%Nb pressure tubes by synchrotron X-ray diffraction

“…This setup has been widely used to construct strain pole figures for the determination of elastic stresses in several systems. Examples of such applications can be found in the literature (Miller et al, 2005;Yuan et al, 2018;Geandier et al, 2014;Larsson et al, 2004).…”