Combined AFM–SEM study of the diamond nucleation layer on Ir(001)

Gsell, S.; Schreck, M.; Benstetter, Günther; Lodermeier, Edgar; Stritzker, B.

doi:10.1016/j.diamond.2006.11.091

Cited by 23 publications

(11 citation statements)

References 20 publications

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“…Although both were processed under essentially identical BEN conditions, they showed completely different results in terms of nucleation density. This behaviour is due to the fact that minimum differences in the local ion bombardment conditions can determine whether diamond nucleation takes place or not [14]. Besides the two BEN samples, a pure iridium layer and a heteroepitaxial diamond film served as reference samples for the evaluation of the data.…”

Section: Resultsmentioning

confidence: 99%

“…To determine the forward scattering patterns the authors measured Several independent methods have indicated that it is a continuous closed carbon film with a high electrical resistivity. Outside the domains its structure is purely amorphous while inside the domains diamond nuclei are embedded [14,16]. A closed layer structure is an imperative precondition for a reasonable evaluation of film thicknesses from XPS peak intensities.…”

Section: Discussionmentioning

confidence: 99%

“…Despite extensive studies [12,13,14], the mechanisms of BEN on iridium are still not fully understood. After successful diamond nucleation we observe a characteristic pattern formation, i.e.…”

Section: Introductionmentioning

confidence: 99%

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Comparative electron diffraction study of the diamond nucleation layer on Ir(001)

Gsell

Berner

Brugger

et al. 2008

Diamond and Related Materials

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Comparative electron diffraction study of the diamond nucleation layer on Ir (001) Gsell, S; Berner, S; Brugger, T; Schreck, M; Brescia, R; Fischer, M; Greber, T; Osterwalder, J; Stritzker, BGsell, S; Berner, S; Brugger, T; Schreck, M; Brescia, R; Fischer, M; Greber, T; Osterwalder, J; Stritzker, B (2008 Comparative electron diffraction study of the diamond nucleation layer on Ir(001) AbstractThe carbon layer formed during the bias enhanced nucleation (BEN) procedure on iridium has been studied by different electron diffraction techniques. In reflection high energy electron diffraction (RHEED) and low energy electron diffraction (LEED) the carbon nucleation layer does not give any indication of crystalline diamond even if the presence of domains proves successful nucleation. In contrast, X-ray photoelectron diffraction (XPD) shows a clear C 1s pattern when domains are present after BEN. The anisotropy in the Ir XPD patterns is reduced after BEN while the fine structure is essentially identical compared to a single crystal Ir film. The change in the Ir XPD patterns after BEN can be explained by the carbon layer on top of a crystallographically unmodified Ir film. The loss and change in the fine structure of the C 1s patterns as compared to a single crystal diamond film are discussed in terms of mosaicity and a defective structure of the ordered fraction within the carbon layer.The present results suggest that the real structure of the BEN layer is more complex than a pure composition of small but perfect diamond crystallites embedded in an amorphous matrix. The carbon layer formed during the bias enhanced nucleation (BEN) procedure on iridium has been studied by different electron diffraction techniques. In reflection high energy electron diffraction (RHEED) and low energy electron diffraction terms of mosaicity and a defective structure of the ordered fraction within the carbon layer. The present results suggest that the real structure of the BEN layer is more complex than a pure composition of small but perfect diamond crystallites embedded in an amorphous matrix.

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Section: Resultsmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

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Comparative electron diffraction study of the diamond nucleation layer on Ir(001)

Gsell

Berner

Brugger

et al. 2008

Diamond and Related Materials

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“…Furthermore, combined systems have been designed to use these two complementary microscopes for important in-situ 1,2 as well as multifunctional [3][4][5] applications, with several commercial models now available.…”

Section: Introductionmentioning

confidence: 99%

Cross-sectional atomic force microscope in scanning electron microscope

Park

Song

Kim

et al. 2014

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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A newly designed atomic force microscope (referred to as “cross-sectional AFM” or “xAFM”) is demonstrated that enables tip–sample interactions to be studied directly from a cross-sectional scanning electron microscope (SEM) view during AFM operation. Previously, such interactions have only been modeled using computer simulations or sensor-generating data. The xAFM will allow researchers to acquire additional visual information not available with conventional microscopic techniques. The xAFM is operated in a tungsten filament SEM, by examining a grating sample that is cleaved and mounted on the sample scanner so that the cleaved cross section faces upwards toward the bottom of the electron column. The tip scans horizontally, parallel to and at a height slightly lower than the cross-sectional surface of the sample but within the depth of focus of the SEM. Three experiments are described that show the unique features of the xAFM. The first demonstrates direct observation of the “tip-convolution” in real-time SEM images. The second shows unambiguous identification of an artifact in the lateral force microscope, from which a “double dip” appears in the signal from a damaged tip in a backward scan of the grating surface. The third enables measurements from blurred SEM images of large-amplitude oscillating high-Q AFM cantilevers in vacuum.

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“…Elimelech et al (1997) coupled contact mode AFM and SEM measurements to demonstrate the influence of the roughness of membranes on fouling by a colloidal suspension of silica. Gsell et al (2007) studied the diamond nucleation layer on Iridium (001): AFM and SEM were combined to form images of a small identical area on the sample. In the biological field, Ubbink and Schär-Zammaretti (2005) worked on bacterial interactions; integration of electron microscopy and AFM data is discussed for various bacterial strains.…”

Section: Introductionmentioning

confidence: 99%

COMBINING WLI AND SEM TECHNIQUES TO OBTAIN A 4D SURFACE IMAGE OF A ppHDMSO/AlCeO3 NANOCOMPOSITE

Buchheit¹,

Arnoult²,

Eddoumy³

et al. 2011

Image Anal Stereol

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Compositional images from a SEM (scanning electron microscope) are sometimes complemented by quantitative topographical data from devices such as an AFM (atomic force microscope) or WLI (white light interferometer). Indeed, even if a SEM could provide both kinds of information (composition and topography), the topographical data are incomplete because the SEM does not allow measuring the vertical dimension (i.e., perpendicular to the measurement plane). Thus these two kinds of information are usually measured using two different techniques, and at different locations on the sample. Mean values of surface composition are then linked to mean values of topography, and as a consequence this approach does not allow precisely linking a local topographical peak to its corresponding composition. The present work deals with a SEM/WLI combination methodology, based on the characterization, at the same location, of a nanocomposite (nanoparticles of AlCeO 3 dispersed in a plasma-polymerized hexamethyldisiloxane ppHMDSO matrix and deposited by atmospheric plasma on a glass substrate) developed for improving anticorrosion properties. SEM images allow the supposition that the protuberances (peaks) observed on the surface of a specimen are linked to the nanoparticles dispersed in the polymer coating, but this link is not fully convincing. Thanks to a precise localization method, SEM compositional data and WLI topographical data are here measured at the same location. The recombination of both signals to form a 4D image (3D geometry and 1D composition) allows linking protuberances to nanoparticles aggregates without ambiguity. This composite image appears to be an interesting new tool (at the scale of observation, i.e., hundreds of micrometers) for the study of nanostructured coatings.

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Combined AFM–SEM study of the diamond nucleation layer on Ir(001)

Cited by 23 publications

References 20 publications

Comparative electron diffraction study of the diamond nucleation layer on Ir(001)

Comparative electron diffraction study of the diamond nucleation layer on Ir(001)

Cross-sectional atomic force microscope in scanning electron microscope

COMBINING WLI AND SEM TECHNIQUES TO OBTAIN A 4D SURFACE IMAGE OF A ppHDMSO/AlCeO3 NANOCOMPOSITE

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