2022
DOI: 10.1109/led.2022.3212681
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Cold Source Diodes With Sub-Unity Ideality Factor and Giant Negative Differential Resistance

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Cited by 4 publications
(2 citation statements)
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“…The valence bands are overall more dispersive than the conduction bands. In terms of the PDOS, it is continuous in energy below the VBM but discrete above the CBM because of the presence of subgaps, which can lead to the NDR phenomenon when the materials are applied to FETs. ,, Besides, the electronic states near the VBM are mainly contributed from the p x and p y atomic orbitals, while those near the CBM are from the s and p z orbitals. We also summarized the band gaps as a function of the thickness of the 2D KL-Si layers, and the results computed at the level of HSE06, PBE-1/2, and PBE functionals have been displayed in Figure f.…”
Section: Resultsmentioning
confidence: 99%
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“…The valence bands are overall more dispersive than the conduction bands. In terms of the PDOS, it is continuous in energy below the VBM but discrete above the CBM because of the presence of subgaps, which can lead to the NDR phenomenon when the materials are applied to FETs. ,, Besides, the electronic states near the VBM are mainly contributed from the p x and p y atomic orbitals, while those near the CBM are from the s and p z orbitals. We also summarized the band gaps as a function of the thickness of the 2D KL-Si layers, and the results computed at the level of HSE06, PBE-1/2, and PBE functionals have been displayed in Figure f.…”
Section: Resultsmentioning
confidence: 99%
“…The PVRs over 10 7 in the Si 9 H 6 -based nFET are much higher than those reported in previous studies at the same simulation level. 36,37,44 According to our previous study, 15 the giant NDR is caused by the presence of sub-gap over the CBM, which can modulate the band alignment/misalignment from the source to drain under the bias voltages V ds . For comparison, the output characteristics of a Si 9 H 6 -based pFET have been displayed in Figure S4 of the Supporting Information.…”
Section: Devices Transport Propertiesmentioning
confidence: 96%