Cohesive Coverage Management: Simulation Meets Formal Methods

Hazra, Aritra; Ghosh, Priyanka; Dasgupta, Pallab; Chakrabarti, P. P.

doi:10.1007/s10836-012-5308-1

Cited by 3 publications

(1 citation statement)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…V&V are key processes since 80% of product's total manufacturing cost is locked in at the conceptual design phase (Kim et al, 2015) and both V&V are related with the appraisal costs (Aleem et al, 2003). Multiple economic benefits from effective V&V can be realized from reduction of the appraisal costs (VDI, 2002), decrease of the product design costs (Hazra et al, 2012), improved product performance and reliability , identification of design flaws at an early stage (Zhou et al, 2015), decrease of the rework of a product and promotion of the most suitable Quality Management strategy (Aleem et al, 2003).…”

Section: Introductionmentioning

confidence: 99%

Verification and validation: a novel product lifecycle management-based approach

Karkasinas

Rentizelas

2019

IJPLM

View full text Add to dashboard Cite

This work sets out to provide clarity on the current use of Verification and Validation (V&V) practices across the product's lifecycle and proposes a novel product lifecycle managementbased V&V approach. By systematically analysing the literature, stages, scope, methods and techniques used for V&V were investigated, leading to classification and clustering of the V&V methods or techniques from the product's lifecycle perspective. The analysis revealed that V&V are not currently addressed as lifecycle processes, they are largely absent from the post-production phases and provided insights on how V&V can be applied across the product's lifecycle by proposing a novel Product Lifecycle Management-based (PLM) approach for V&V. This paper is the first to map the 'as is' V&V practices across the product's lifecycle and supports the engineers and academics on how V&V processes can be applied beyond the internal organizational boundaries by developing a PLM based approach for V&V.

show abstract