Coefficients of thermal expansion of thin metal films investigated by non-ambient X-ray diffraction stress analysis

Kuru, Yener; Wohlschlögel, M.; Welzel, U.; Mittemeijer, E. J.

doi:10.1016/j.surfcoat.2007.08.002

Cited by 26 publications

(11 citation statements)

References 28 publications

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“…Rupp and Birringer have found the TEC values for NC copper with a 8‐nm grain size to be nearly twice that of those in regular polycrystalline copper. An increasing TEC was also observed for Cu, Ni, and Pd nanoparticles via in‐situ X‐ray diffraction measurements.…”

Section: Introductionmentioning

confidence: 71%

Thermal expansion coefficient of carbon‐supported Pt nanoparticles: In‐situ X‐ray diffraction study

Leontyev

Kulbakov

Allix

et al. 2017

Physica Status Solidi (b)

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The thermal expansion of carbon‐supported Pt nanoparticles with different particle size has been studied in‐situ via X‐ray diffraction at temperatures from 100 to 300 K. The thermal expansion coefficient (TEC) of investigated Pt/C nanoparticles is always superior to that of bulk Pt. When the grain size D decreases from 11 to 3 nm, the TEC nonlinearly increases by about 1.66 × 10−6 K−1 which corresponds to a variation of ∼20% from bulk Pt. The obtained experimental dependence of TEC for Pt/C nanoparticles has been interpreted using different theoretical approaches. A comparison of the considered models with the experimental data reveals the best agreement from the binding order–length–strength model with the size dependence of TEC experimentally found in carbon‐supported Pt nanoparticles.

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Section: Introductionmentioning

confidence: 71%

Thermal expansion coefficient of carbon‐supported Pt nanoparticles: In‐situ X‐ray diffraction study

Leontyev

Kulbakov

Allix

et al. 2017

Physica Status Solidi (b)

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“…This thermal stress component is expected to be compressive during heating, since a s ¼ 0.56$10 À6 K À1 [54] and a f ¼ 11.8$10 À6 K À1 [55]. Finally, the extrinsic stress s e , caused by structural misfits, phase transformations, plastic or creep deformation, chemical reactions, etc.…”

Section: In-situ Study Of Microstructural Changes During Annealingmentioning

confidence: 99%

Effect of structural defects on the hydriding kinetics of nanocrystalline Pd thin films

Delmelle

Amin-Ahmadi

Sinnaeve

et al. 2015

International Journal of Hydrogen Energy

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MicrostructureInternal stress a b s t r a c t While the microstructure of a metal is well-known to affect its equilibrium hydrogen uptake and therefore the hydriding thermodynamics, microstructural effects on the hydriding kinetics are much less documented. Moreover, for thin film systems, such microstructural effects are difficult to separate from the internal stress effect, since most defects generate internal stresses. Such a decoupling has been achieved in this paper for nanocrystalline Pd thin film model systems through the use of a high-resolution, in-situ curvature measurement set-up during Pd deposition, annealing and hydriding. This set-up allowed producing Pd thin films with similar internal stress levels but significantly different microstructures. This was evidenced from detailed defect statistics obtained by transmission electron microscopy, which showed that the densities of grain boundaries, dislocations and twin boundaries have all been lowered by annealing. The same set-up was then used to study the hydriding equilibrium and kinetic behaviour of the resulting films at room temperature. A full quantitative analysis of their hydriding cycles showed that the rate constants of both the adsorption-and absorption-limited kinetic regimes were strongly affected by microstructure. Defect engineering was thereby shown to increase the rate constants for hydrogen adsorption and absorption in Pd by a factor 40 and 30, respectively.

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“…Email: anderson.1@osu.edu has been used to study single-layer metallic films on substrates. [16][17][18][19] For Al [18] and Cu films [20] on Si substrates, it provides values of film stress comparable to those from curvature measurements. Despite this extensive work, in situ X-ray diffraction has not been reported for multilayers.…”

Section: Abstract: Nanolaminates X-ray Diffraction Interface Propermentioning

confidence: 77%

X-Ray Diffraction Studies of Forward and Reverse Plastic Flow in Nanoscale Layers During Thermal Cycling

Gram

Carpenter

Payzant

et al. 2013

Materials Research Letters

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Coefficients of thermal expansion of thin metal films investigated by non-ambient X-ray diffraction stress analysis

Cited by 26 publications

References 28 publications

Thermal expansion coefficient of carbon‐supported Pt nanoparticles: In‐situ X‐ray diffraction study

Thermal expansion coefficient of carbon‐supported Pt nanoparticles: In‐situ X‐ray diffraction study

Effect of structural defects on the hydriding kinetics of nanocrystalline Pd thin films

X-Ray Diffraction Studies of Forward and Reverse Plastic Flow in Nanoscale Layers During Thermal Cycling

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