2004
DOI: 10.1109/tcsii.2004.836034
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Code-Width Testing-Based Compact ADC BIST Circuit

Abstract: This paper proposes a new analog-to-digital converter (ADC) built-in self-test (BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults … Show more

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Cited by 33 publications
(16 citation statements)
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References 19 publications
(14 reference statements)
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“…[11] has introduced a testing methodology for current-mode ADC's. [12] has proposed an ADC BIST based on code width and sample difference testing. [13] has proposed a calibration technique using correlation-based successive coefficient measurements.…”
Section: Previous Workmentioning
confidence: 99%
“…[11] has introduced a testing methodology for current-mode ADC's. [12] has proposed an ADC BIST based on code width and sample difference testing. [13] has proposed a calibration technique using correlation-based successive coefficient measurements.…”
Section: Previous Workmentioning
confidence: 99%
“…Also, the speeding up of the testing phase in components/devices, leads to increased productivity and the results preserves the reliability towards the operation of the produced electronic circuits and systems. [1][2][3][4][5][6] In recent years supply current testing of analog circuits has been investigated and various approaches have emerged [7][8][9][10]. The determination of the "signature" which will be used for fault detection is crucial to the system.…”
Section: Introductionmentioning
confidence: 99%
“…To reduce the cost in terms of test time and instrumentation requirements, current applications are demanding simple BIST methods. This necessity becomes critical for data converters, and more specifically for ADCs, due to their mixed-signal nature [1]- [2]. These BIST solutions need detecting the correct or faulty operation of the ADC within a changing environment, as both voltage supplies and temperature conditions are hardly depending on the whole system activity.…”
Section: Introductionmentioning
confidence: 99%