2007
DOI: 10.1299/jamdsm.1.743
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Cleaning of Dust between Interactive Contact Surfaces by Application of Normal Loads of Artificial Stainless-Cantilever in AFM

Abstract: In this study, we investigated that interactive contact surfaces were affected by dust and applied normal loads of cantilever such as bristles. In order to study the effect of interactive contact surfaces, spherical particles (dry borosilicate glass sphere, plastic sphere) with curvature radius(R=5µm, R=10µm) were glued to artificial stainless cantilevers (spring constant k=576.7N/m). The experiments were performed on various normal applied loads using an AFM (Atomic force microscope). The results indicate tha… Show more

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“…(b) In order to fine the surface's conditions, we performed scanning work within the previous scan ranges of 50 µm x 50 µm (substrates: 20 µm x 20 µm, glass sphere: 10 µm x 10 µm) using a commercial silicon cantilever (k n =2N/m), respectively. When the stainless cantilever is abraded on the substrate with dust, dust is carried in the edge of scan range and accumulated by the locomotion of cantilever (18) . Especially, the volume of dust on sphere surface with asperity array is measured by the next method.…”
Section: Measurements Using An Afm (Atomic Force Microscope)mentioning
confidence: 99%
“…(b) In order to fine the surface's conditions, we performed scanning work within the previous scan ranges of 50 µm x 50 µm (substrates: 20 µm x 20 µm, glass sphere: 10 µm x 10 µm) using a commercial silicon cantilever (k n =2N/m), respectively. When the stainless cantilever is abraded on the substrate with dust, dust is carried in the edge of scan range and accumulated by the locomotion of cantilever (18) . Especially, the volume of dust on sphere surface with asperity array is measured by the next method.…”
Section: Measurements Using An Afm (Atomic Force Microscope)mentioning
confidence: 99%