Classification of surface structures on fine metallic wires

Abstract

In this report a classi®cation of the main surface structures found on ®ne metallic wires is carried out (between $20 and 500 mm in diameter). For this, we have analyzed a series of wires of different metallic materials, diameters and production environments by scanning electron microscopy, atomic force microscopy, and confocal microscopy. A description and the images of the structures is given and, in addition, a nomenclature to be used by manufacturers, customers and researches is proposed. With this information the surface quality of ®ne metallic wires may be improved in a fabrication level. One of the objectives of this catalogue of defects is to serve as a basis for measuring the quality of the surface of the wires during the production process and the development of a measuring device for that purpose.

Cylindrical Three-Dimensional Porous Anodic Alumina Networks

“…The as-received Al wires presented as longitudinal die lines, which are longitudinal lines produced by pulling the Al rod through a drawing die process [18]. These die lines remained even after the electropolishing process ( Figure 2).…”

Quantitative Surface Characterisation Using Laser Scanning Confocal Microscopy

“…Standard scanning electron microscopy (SEM) has been extensively used for characterising surface features. Scanning electron microscopy has outstanding 2D resolution and with specialised SEM operation can also provide 3D images (Podsiadlo and Stachowiak 1997;Bernabeu et al, 2001). However, in addition to the specialised preparation time required, the fact samples are modified during preparation and possibly during image acquisition are issues to consider when using SEM (Brown and Newton, 1994;Chescoe and Goodhew, 1990;Hanlon et al, 2001).…”

“…The confocal system also provides a greater field of view and depth range than AFM, which is more suitable for industrial surfaces measurements. In addition, the minimal specimen preparation for LSCM imaging sets the technique to be a fast and versatile instrument for quantitative surface measurements (King and Delaney, 1994;Gjonnes, 1996;Bernabeu et al, 2001;Sheppard and Shotton, 1997;Haridoss et al, 1990). Past research using traditional 2D parameters for quantitative surface analysis found good correlation between roughness measurements of metal surfaces determined by LSCM, stylus and AFM surface measurement techniques (Gjonnes, 1996;Hanlon et al, 2001;Peng and Tomovich, 2008).…”

Effect of the refraction index in the diameter estimation of thin metallic wires

“…The surface quality of these thin metallic wires plays an important role in some high technological applications. For example defects over the wire surface may change some physical and chemical properties of the wire [1,2]. For this reason it is important to study and to characterize the wire surface defects in order to carry out an effective quality control in the manufacturing process.…”