2016
DOI: 10.5755/j01.eie.22.6.17227
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Classification of Knot Defect Types Using Wavelets and KNN

Abstract: Automatic defect classification methods are important to increase the productivity of the forest industry. In this respect, classification is also an important component of a pattern recognition system. Well designated classification algorithm will make recognition process more efficient and productive. Quality control is one of the most important steps among the applications that use classification. There are various techniques which are available in order to check quality of wooden material. However, display… Show more

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Cited by 23 publications
(16 citation statements)
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“…Finally, defect images were classified based on a KNN algorithm with an average accuracy rate of 96%. Cetiner et al [158] proposed a method of feature extraction based on the wavelet moment and defect image classification based on KNN, which can be used in automatic defect classification systems in the forest industry. Das and Jena [159] presented a method combining image texture feature extraction techniques.…”
Section: Classificationmentioning
confidence: 99%
“…Finally, defect images were classified based on a KNN algorithm with an average accuracy rate of 96%. Cetiner et al [158] proposed a method of feature extraction based on the wavelet moment and defect image classification based on KNN, which can be used in automatic defect classification systems in the forest industry. Das and Jena [159] presented a method combining image texture feature extraction techniques.…”
Section: Classificationmentioning
confidence: 99%
“…Computer vision systems using high-resolution and high-speed video cameras scan products and report on product quality through various algorithms and techniques. Several methods can be used for surface analysis, such as Gabor [4] or wavelet [5] transforms, and deep learning techniques [6][7][8][9][10], but they are not always sufficiently accurate or fast. For example, the double threshold method is used to check the quality of materials in the textile industry [11] to reduce the amount of data in the images used for the training of neural networks.…”
Section: Introductionmentioning
confidence: 99%
“…Schmoldt et al (1997) investigated using a multi-layer perceptron neural network to identify and locate internal log defects. In addition, techniques such as Gabor or wavelet can also be used to scan products and report defects (Lampinen et al 1998;Cetiner et al 2016). However, expensive equipment and several steps are necessary for defect classification and detection.…”
Section: Introductionmentioning
confidence: 99%