2015
DOI: 10.1063/1.4928189
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Cl-doping of Te-rich CdTe: Complex formation, self-compensation and self-purification from first principles

Abstract: The coexistence in Te-rich CdTe of substitutional Cl-dopants, ClTe, which act as donors, and Cd vacancies, VCd−1, which act as electron traps, was studied from first principles utilising the HSE06 hybrid functional. We find ClTe to preferably bind to VCd−1 and to form an acceptor complex, (ClTe–VCd)−1. The complex has a (0,-1) charge transfer level close to the valence band and shows no trap state (deep level) in the band gap. During the complex formation, the defect state of VCd−1 is annihilated and leaves th… Show more

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Cited by 18 publications
(20 citation statements)
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References 36 publications
(52 reference statements)
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“…2 The Cl Te nearest neighbor is displaced away from the vacancy Cd site by 5.0%, while the three Te ions relax toward the site by 1.3% and the slight increase in the lifetime obtained (Table I), compared to the unrelaxed V Cd , is consistent with these relaxations. The recently calculated structure for the neutral charge state of the Te vacancy (Fig.…”
supporting
confidence: 74%
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“…2 The Cl Te nearest neighbor is displaced away from the vacancy Cd site by 5.0%, while the three Te ions relax toward the site by 1.3% and the slight increase in the lifetime obtained (Table I), compared to the unrelaxed V Cd , is consistent with these relaxations. The recently calculated structure for the neutral charge state of the Te vacancy (Fig.…”
supporting
confidence: 74%
“…Characterization of point defects in CdTe by positron annihilation spectroscopy M. R. M. Elsharkawy, 1,2 G. S. Kanda, 1 E. E. Abdel-Hady, 2 Positron lifetime measurements on CdTe 0.15% Zn-doped by weight are presented, trapping to monovacancy defects is observed. At low temperatures, localization at shallow binding energy positron traps dominates.…”
mentioning
confidence: 99%
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“…Although some of doped Cl atoms are located in grain boundaries, many Cl atoms would substitute Te atoms as shown in a schematic crystal lattice (inset of Fig. 3b ), donating electrons whose concentration could be in the order of ~10 15 cm −3 29 32 . As a result, those number electrons would compensate most of the holes in principle, depleting the charge carriers.…”
Section: Resultsmentioning
confidence: 99%
“…CdTe has cubic Zinc Blende structure and maintains p-type conduction after growth in general 27 , 28 . For low voltage operation, we applied Cl doping at all stages of CdTe film deposition to control or reduce the hole concentration of p-type CdTe, which then plays as Schottky diode material for Ti(or Al) electrode showing ohmic behavior for Au 29 32 . As a result, our CdTe Schottky diode/CMOS array demonstrates much higher resolution X-ray imaging in 7 × 9 cm 2 large scale as a direct conversion APS imager than that of CsI/CMOS array, an indirect conversion imager.…”
Section: Introductionmentioning
confidence: 99%