“…The analysis and optimization of analog circuits considering process variations alone have been in research for decades, and certain design centering algorithms and commercial software are available to achieve a design for yield (more specifically, fresh yield) (Nassif, 2008), (Antreich et al, 1994). On the other hand, the modeling of device parameter degradations such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) has been so far focusing mainly on the nominal values without considering the underlying variations during manufacture process (Jha et al, 2005), (Liu et al, 2006) and (Martin-Martinez et al, 2009).…”