Luminescence measurements in aqueous solutions were performed upon n-GaN layers grown on sapphire substrates and on Si substrates. Photoluminescence ͑PL͒ measurements at n-GaN/sapphire and n-GaN/Si electrodes show an identical emission band centered at 2.20 eV ͑the well-known yellow luminescence band͒, showing that the same deep acceptor level is present in both materials. Additional reddish luminescence is observed when the holes are injected from the solution ͓electroluminescence ͑EL͔͒, which may be ascribed to the occurrence of radiative ͑near͒ surface recombination. From an analysis of the potential dependence of both the PL and EL intensity of the 2.20-eV band, it may be concluded that this band possesses a significant contribution from the ͑near͒ surface.