Chemically addressed switching measurements in graphene electrode memristive devices using in situ XPS

Abstract

In situ measurements using XPS were performed on Pt/TiO2/TiOx/graphene structures to chemically address switching and hysteresis.

Enhancing memristor fundamentals through instrumental characterization and understanding reliability issues

“…51,52 Due to these capabilities, XPS has been utilized in memristor applications to identify the chemical composition, doping states and functional bonding of the memristor components (i.e., switching layer and electrodes). [53][54][55][56][57][58][59][60][61][62][63] Therefore, XPS is instrumental to analyze the major factors which control the evolution of the filaments and hence enhance the fundamentals of the switching mechanisms.…”

“…, switching layer and electrodes). 53–63 Therefore, XPS is instrumental to analyze the major factors which control the evolution of the filaments and hence enhance the fundamentals of the switching mechanisms.…”