2021
DOI: 10.1016/j.matchemphys.2021.124478
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Chemical stability diagrams as a powerful tool to the synthesis of Cu2SnS3 thin films by chemical bath deposition

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Cited by 7 publications
(1 citation statement)
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“…e activity structural analysis of as-deposited, processed thin films on glass substrate was performed using the X-ray diffraction (XRD) technique [17]. e spectra of the as-deposited ZnS film are shown in Figure 2 e formation of collars between jots indicates the porousness of grains.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…e activity structural analysis of as-deposited, processed thin films on glass substrate was performed using the X-ray diffraction (XRD) technique [17]. e spectra of the as-deposited ZnS film are shown in Figure 2 e formation of collars between jots indicates the porousness of grains.…”
Section: X-ray Diffractionmentioning
confidence: 99%