Chemical force microscopy: probing chemical origin of interfacial forces and adhesion

Vezenov, Dmitri V.; Noy, Aleksandr; Ashby, Paul D.

doi:10.1163/1568561054352702

Cited by 73 publications

(88 citation statements)

References 96 publications

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“…Both of these approaches provide robust and well-defined coatings; the resulting monolayers can present a variety of chemical functionalities suitable for further modification. Reference [14] presents a detailed review of probe functionalization techniques.…”

Section: Probe Modification and Force Measurementmentioning

confidence: 99%

“…Careful design of the probe coating can also prevent contaminations, control the number of interacting molecules, and even separate different types of interactions spatially. Some of the progress and key results of Chemical Force Microscopy have been the subject of two detailed reviews [13,14]. Despite their apparent simplicity, CFM measurements have already uncovered a wealth of complex behavior that even the simplest intermolecular interaction can display during force-induced failure.…”

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confidence: 99%

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Chemical force microscopy of chemical and biological interactions

Noy

2006

Surface & Interface Analysis

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Interactions between chemical functionalities define outcomes of the vast majority of important events in chemistry, biology and materials science. Chemical Force Microscopy (CFM)-a technique that uses direct chemical functionalization of AFMprobes with specific functionalities -allows researchers to investigate these important interactions directly. We review the basic principles of CFM, some examples of its application, and theoretical models that provide the basis for understanding the experimental results. We also emphasize application of modern kinetic theory of non-covalent interactions strength to the analysis of CFM data.

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Section: Probe Modification and Force Measurementmentioning

confidence: 99%

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confidence: 99%

Chemical force microscopy of chemical and biological interactions

Noy

2006

Surface & Interface Analysis

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“…In contrast with the situation for 'hard' materials in vacuo, where numerous analytical methods exist to detect and map atomic species, there is a dearth of appropriate characterization methods for 'soft' molecular materials, where noncovalent molecular interactions are paramount, and applications often involve 'wet' conditions. Methods based on scanning probe microscopy (SPM, for example, chemical force microscopy [9][10][11] ) can provide some local information about surface interactions. However, SPM has significant limitations in this regard, not the least of which is the need to understand the surface chemistry of the probe tip itself.…”

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confidence: 99%

Super-resolution surface mapping using the trajectories of molecular probes

2011

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The surface characterization of 'soft' materials presents a significant scientific challenge, particularly under 'wet' in situ conditions where a wide variety of non-covalent interactions may be relevant. Here we introduce a new chemical imaging method, mAPT (mapping using accumulated probe trajectories) that generates images of surface interactions by distributing different aspects of molecular probe trajectories into distinct locations and then combining many trajectories to generate spatial maps. The maps are super-resolution in nature, because they are accumulated from highly localized single-molecule observations. unlike other super-resolution techniques, which report only photon or point counts, our analysis generates spatial maps of physical quantities (adsorption rate, desorption probability, local surface diffusion coefficient, surface coverage/occupancy) that are directly associated with the molecular interactions between the probe molecule and the surface. We demonstrate the feasibility of this characterization using a surface patterned with various degrees of hydrophobicity.

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“…Nonetheless, this tilt effect can be corrected precisely via x-compensation, provided that static friction is not so high as to prevent slippage of the tip appreciably. This technique is crucial to a variety of nanotribological and nanomechanical research studies, such as studies of wear in which it is important to scan the same line over a range of loads, 18 chemical force microscopy ͑CFM͒ when tip-sample separation must be restricted to the direction normal to the surface for adhesion measurements on spatially or chemically heterogeneous surfaces, 19,20 and carbon nanotube buckling experiments for which pure axial loads are desired. Most previous work has neglected this effect, despite its importance for experiments that employ long contact mode levers with low force constants.…”

Section: Discussionmentioning

confidence: 99%

Cantilever tilt compensation for variable-load atomic force microscopy

Cannara

Brukman

Carpick

2005

Review of Scientific Instruments

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In atomic force microscopy ͑AFM͒, typically the cantilever's long axis forms an angle with respect to the plane of the sample's surface. This has consequences for contact mode experiments because the tip end of the cantilever, which is constrained to move along the surface, displaces longitudinally when the applied load varies. As a result, the AFM tip makes contact with a different point on the surface at each load. These different positions lie along the projection of the lever's long axis onto the surface. When not constrained by static friction, the amount of tip-displacement is, to first order, proportional to the load and is shown to be substantial for typical AFM and cantilever geometries. The predictions are confirmed experimentally to within 15% or better. Thus, care should be taken when performing load-dependent contact mode experiments, such as friction versus load, elasticity versus load, or force versus displacement measurements, particularly for heterogeneous or topographically-varying samples. We present a simple method to reliably and precisely compensate for in-plane tip displacement that depends only on the range of vertical motion used to vary the load. This compensation method should be employed in any load-varying AFM experiment that requires the tip to scan the same line or to remain at the same point at each load.

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Chemical force microscopy: probing chemical origin of interfacial forces and adhesion

Cited by 73 publications

References 96 publications

Chemical force microscopy of chemical and biological interactions

Chemical force microscopy of chemical and biological interactions

Super-resolution surface mapping using the trajectories of molecular probes

Cantilever tilt compensation for variable-load atomic force microscopy

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