From the early tribological studies of Leonardo da Vinci to Amontons' law, friction has been shown to increase with increasing normal load. This trend continues to hold at the nanoscale, where friction can vary nonlinearly with normal load. Here we present nanoscale friction force microscopy (FFM) experiments for a nanoscale probe tip sliding on a chemically modified graphite surface in an atomic force microscope (AFM). Our results demonstrate that, when adhesion between the AFM tip and surface is enhanced relative to the exfoliation energy of graphite, friction can increase as the load decreases under tip retraction. This leads to the emergence of an effectively negative coefficient of friction in the low-load regime. We show that the magnitude of this coefficient depends on the ratio of tip-sample adhesion to the exfoliation energy of graphite. Through both atomistic- and continuum-based simulations, we attribute this unusual phenomenon to a reversible partial delamination of the topmost atomic layers, which then mimic few- to single-layer graphene. Lifting of these layers with the AFM tip leads to greater deformability of the surface with decreasing applied load. This discovery suggests that the lamellar nature of graphite yields nanoscale tribological properties outside the predictive capacity of existing continuum mechanical models.
Proper force calibration is a critical step in atomic and lateral force microscopies ͑AFM/LFM͒. The recently published torsional Sader method ͓C. P. Green et al., Rev. Sci. Instrum. 75, 1988 facilitates the calculation of torsional spring constants of rectangular AFM cantilevers by eliminating the need to obtain information or make assumptions regarding the cantilever's material properties and thickness, both of which are difficult to measure. Complete force calibration of the lateral signal in LFM requires measurement of the lateral signal deflection sensitivity as well. In this article, we introduce a complete lateral force calibration procedure that employs the torsional Sader method and does not require making contact between the tip and any sample. In this method, a colloidal sphere is attached to a "test" cantilever of the same width, but different length and material as the "target" cantilever of interest. The lateral signal sensitivity is calibrated by loading the colloidal sphere laterally against a vertical sidewall. The signal sensitivity for the target cantilever is then corrected for the tip length, total signal strength, and in-plane bending of the cantilevers. We discuss the advantages and disadvantages of this approach in comparison with the other established lateral force calibration techniques, and make a direct comparison with the "wedge" calibration method. The methods agree to within 5%. The propagation of errors is explicitly considered for both methods and the sources of disagreement discussed. Finally, we show that the lateral signal sensitivity is substantially reduced when the laser spot is not centered on the detector.
Atomic force microscopy (AFM) experiments and molecular dynamics (MD) simulations were conducted to examine single-asperity friction as a function of load, surface orientation, and sliding direction on individual crystalline grains of diamond in the wearless regime. Experimental and simulation conditions were designed to correspond as closely as state-of-the-art techniques allow. Both hydrogen-terminated diamond (111)(1 x 1)-H and the dimer row-reconstructed diamond (001)(2 x 1)-H surfaces were examined. The MD simulations used H-terminated diamond tips with both flat- and curved-end geometries, and the AFM experiments used two spherical, hydrogenated amorphous carbon tips. The AFM measurements showed higher adhesion and friction forces for (001) vs (111) surfaces. However, the increased friction forces can be entirely attributed to increased contact area induced by higher adhesion. Thus, no difference in the intrinsic resistance to friction (i.e., in the interfacial shear strength) is observed. Similarly, the MD results show no significant difference in friction between the two diamond surfaces, except for the specific case of sliding at high pressures along the dimer row direction on the (001) surface. The origin of this effect is discussed. The experimentally observed dependence of friction on load fits closely with the continuum Maugis-Dugdale model for contact area, consistent with the occurrence of single-asperity interfacial friction (friction proportional to contact area with a constant shear strength). In contrast, the simulations showed a nearly linear dependence of the friction on load. This difference may arise from the limits of applicability of continuum mechanics at small scales, because the contact areas in the MD simulations are significantly smaller than the AFM experiments. Regardless of scale, both the AFM and MD results show that nanoscale tribological behavior deviates dramatically from the established macroscopic behavior of diamond, which is highly dependent on orientation.
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