Charging effects of PET under electron beam irradiation in a SEM

Jbara, O.; Fakhfakh, S.; Belhaj, Mohamed; Rondot, S.; Hadjadj, A.; Patat, J. M.

doi:10.1088/0022-3727/41/24/245504

Cited by 28 publications

(14 citation statements)

References 24 publications

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“…However, σ should vary with the surface electric field under e‐beam irradiation. Note that, σ may somewhat vary with the surface state, the SE collector etc 39,40 …”

Section: Results and Analysesmentioning

confidence: 99%

Self‐consistent charging of PMMA thin film induced by a penetrating electron beam in electron microscopy

Qian²

2021

Journal of Microscopy

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The charging of the polymer thin film irradiated by penetrating electron beam (e‐beam) is investigated, in parallel with the numerical simulation and experiment. The simulation is performed by combining scattering, drift, diffusion, trapping and recombination. Results show that, due to the electron emission the net charge near the surface is distribution positively, but negatively inside the film because of low electron mobility. The surface potential is positive near surface and accordingly forces some of secondary electrons to return surface. As irradiation proceeds, currents flowing into and out of the film can tend to equilibrium. In the equilibrium state, with increasing beam energy, the surface potential and the efficient emission current decrease, and the electron beam‐induced current and the transmission current tend to zero and the beam current valuable, respectively. E‐beams of 10‐30 keV cause positive charging on PMMA film of 2 µm, which means the high‐energy e‐beam can effectively discharge a thin film that has been charged negatively by irradiation with low‐energy e‐beam. With the increase of the film thickness from 1 to 3 µm, the positive surface potential and the emission current decreases and increases, respectively, and the transmission current tends to zero.

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“…However, σ should vary with the surface electric field under e‐beam irradiation. Note that, σ may somewhat vary with the surface state, the SE collector etc 39,40 …”

Section: Results and Analysesmentioning

confidence: 99%

Self‐consistent charging of PMMA thin film induced by a penetrating electron beam in electron microscopy

Qian²

2021

Journal of Microscopy

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“…Indeed, this trend is explained well in the light of the expression giving the displacement current that involves the secondary emission yield σ , the escape depth of SE and also the density of traps (Jbara et al. , ).…”

Section: The Investigations Methods Using Electron Irradiation In a Smentioning

confidence: 97%

Effect of nanoclay concentration level on the electrical properties of polypropylene under electron irradiation in a SEM

Ammar¹,

Fakhfakh²,

Jbara

et al. 2016

Journal of Microscopy

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For studying the electrical properties (charge trapping, transport and secondary electron emission) of the polypropylene-based nanocomposites with different contents of natural clay, the specimens were submitted to electron irradiation of a scanning electron microscope. A device, suitably mounted on the sample holder of the scanning electron microscope, was used to measure two currents (i.e. leakage and displacement currents) induced in the polypropylene-based nanocomposites (polymer nanocomposites) under electron irradiation. The evolution of trapped charge during irradiation for each type of studied polymer nanocomposites is deduced. The amount of trapped charge at the steady state is also determined by measuring the change of secondary electron image size associated to the electron trajectory simulation. It is found, surprisingly, that not only the leakage current increases as a function of clay loading level but also trapped charge. However, this could be related to the increase of conductivity in one hand and to proliferation of interfaces between nanoparticles and neighbouring materials on the other hand. These two processes play crucial role in controlling the carrier transport (through polymer nanocomposites or/and along its surface) closely related to the charge storage and leakage current. Additional experiment using dielectric spectroscopy were performed to show the effect of clay concentration in changing the dielectric relaxation behaviour and to evidence the existence of interfaces between nanoparticles and polymer. The secondary electron emission during electron irradiation is also studied through the total electron yield that is deduced by correlating the measured leakage and displacement currents.

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“…The same technique was used by Thome [34] and Jbara [35] for investigation on the evolution of electrical properties of dielectric surfaces under electron bombardment. The study was devoted to electrical charging of the surfaces, therefore, results are not presented here.…”

Section: Indirect Methodsmentioning

confidence: 99%

Experimental investigation of electron emission from dielectric surfaces due to primary electron beam: a review

Chvyreva

Pemen

2014

IEEE Trans. Dielect. Electr. Insul.

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When charged particles impact the surface of a solid material, they can be backscattered from that surface or cause secondary electrons to be emitted. The ratio of the number of emitted electrons (secondary and backscattered) to the incident electrons number is known as the total electron emission yield. Knowledge of this total electron emission yield (TEEY) is highly required in various modern technologies, and several experimental techniques were developed with the purpose of its determination. However, experimental data, obtained with different methods are not in good agreement and sometimes are even contradictive. The purpose of this paper is to review the existing experimental methods of investigating electron emission (EE) from dielectric surfaces, as well as to analyze their accuracy and reliability. The focus is on the processes of the emission from thick layers of insulators which is the case for modern high voltage technologies.

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Charging effects of PET under electron beam irradiation in a SEM

Cited by 28 publications

References 24 publications

Self‐consistent charging of PMMA thin film induced by a penetrating electron beam in electron microscopy

Self‐consistent charging of PMMA thin film induced by a penetrating electron beam in electron microscopy

Effect of nanoclay concentration level on the electrical properties of polypropylene under electron irradiation in a SEM

Experimental investigation of electron emission from dielectric surfaces due to primary electron beam: a review

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