1995
DOI: 10.1063/1.114048
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Charge transfer limitations in δ-doped AlGaAs/InGaAs pseudomorphic high electron mobility transistors

Abstract: Articles you may be interested inExtended radio frequency nonlinear model for power prediction of AlGaAs/InGaAs pseudomorphic high electron mobility transistors Free electron distribution in δdoped InGaAs/AlGaAs pseudomorphic high electron mobility transistor structures J. Appl. Phys. 75, 1586 (1994); 10.1063/1.356395 δdoped AlGaAs and AlGaAs/InGaAs high electron mobility transistor structures grown by metalorganic chemical vapor deposition Molecularbeam epitaxial growth of high quality, double channel AlGaAs/… Show more

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Cited by 12 publications
(3 citation statements)
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“…As we all know, doping is a fundamental approach for controlling the properties of bulk semiconductors [24,25]. From a generalized Anderson-type tight-binding model, Zhong et al [26] proposed a novel class of order-disorder separated quantum film which can be realized through doping part of the bilayer graphene to form a disordered layer on top of an ordered layer.…”
mentioning
confidence: 99%
“…As we all know, doping is a fundamental approach for controlling the properties of bulk semiconductors [24,25]. From a generalized Anderson-type tight-binding model, Zhong et al [26] proposed a novel class of order-disorder separated quantum film which can be realized through doping part of the bilayer graphene to form a disordered layer on top of an ordered layer.…”
mentioning
confidence: 99%
“…This effect will drastically decrease the number of electrons available for transfer to the 2DEG, as most recently pointed out theoretically by Jogai 13 and Tian and co-workers 14 and will also increase the density of the ionized donors. Because the shallow donors in the doped GaAs cap are no longer available, the surface states above the Fermi level are filled by electrons from the shallow donors in the delta doping layer.…”
Section: Resultsmentioning
confidence: 72%
“…Со времени первой демонстрации pHEMT транзисторов [1] ключевые параметры pHEMT значительно улучшены в результате совершенствова-ния конструкции и технологии роста гетероструктур. Двухстороннее δ-легирование позволило повысить кон-центрацию двумерного электронного газа (ДЭГ) до 2 · 10 12 см −2 [2], получение резких и гладких гетеро-границ GaAs/InGaAs квантовой ямы (КЯ) -канала транзистора [3,4], установление оптимального расстоя-ния между δ-слоями и КЯ [5,6], применение составных спейсеров [7,8], использование широкозонных AlAs вста-вок в КЯ [9,10] позволили уверенно получать подвиж-ность электронов свыше 7000 см 2 /В · с при комнатной температуре. Несмотря на все эти значительные усилия, удельная выходная мощность pHEMT -p out долгое время не могла преодолеть порог 1 Вт/мм в частот-ном диапазоне 10−30 ГГц [11][12][13].…”
Section: Introductionunclassified