Charge Multiplication of CCD Based on Electrons Multiplication

Weiji, 何伟基 He; Qian, 陈钱 Chen; Huiming, 屈惠明 Qu; Jian, 秦剑 Qin

doi:10.3788/aos20082806.1161

Cited by 3 publications

(1 citation statement)

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“…However, in the conditions of low-light and all kinds of noise interference, signal to noise ratio of the image signal obtained by the EMCCD imaging system falls with the decline in the image brightness and contrast, and the image resolution has been significantly affected. At present, research about the charge multiplication mechanism, noise characteristics and the imaging circuit model of the EMCCD has made significant achievements [5], [6], [7]. But the noise distribution model of the EMCCD has not been mentioned in literature by far.…”

Section: Introductionmentioning

confidence: 99%

Parameter Estimation of Noise Distribution Model of Electron Multiplying CCD Based on the Moment Estimation

Zou

Liu²,

Zhang

et al. 2012

2012 Symposium on Photonics and Optoelectronics

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The electron multiplying CCD (EMCCD) use impact ionization to provide high gain in the charge domain. This enables performance with an equivalent input noise of much less than 1 rms electron at pixel rates. Based on the discussion of image noise sources and their statistic characteristics of the EMCCD, the noise distribution model is established. The method of moment estimation is applied to complete the parameter estimation of noise distribution model of the EMCCD. A Monte Carlo method is used to do the simulation calculations. Simulation results verify the effectiveness of the method of moment estimation. Acquiring series of images from the EMCCD when there is no signal input, experimental results demonstrate that parameter estimation values agree fairly well with the EMCCD camera parameters.

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Section: Introductionmentioning

confidence: 99%