Parameter Estimation of Noise Distribution Model of Electron Multiplying CCD Based on the Moment Estimation

Abstract

The electron multiplying CCD (EMCCD) use impact ionization to provide high gain in the charge domain. This enables performance with an equivalent input noise of much less than 1 rms electron at pixel rates. Based on the discussion of image noise sources and their statistic characteristics of the EMCCD, the noise distribution model is established. The method of moment estimation is applied to complete the parameter estimation of noise distribution model of the EMCCD. A Monte Carlo method is used to do the simulation calculations. Simulation results verify the effectiveness of the method of moment estimation. Acquiring series of images from the EMCCD when there is no signal input, experimental results demonstrate that parameter estimation values agree fairly well with the EMCCD camera parameters.