2018
DOI: 10.1016/j.ultramic.2018.01.010
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Charge dynamics in aluminum oxide thin film studied by ultrafast scanning electron microscopy

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Cited by 18 publications
(20 citation statements)
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References 30 publications
(46 reference statements)
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“…Specifically, ultrafast SEM monitors light-induced charge dynamics, deriving out-of-equilibrium and hot-charge transport parameters at semiconductor surfaces and pn-junctions. Its application to study charge dynamics in insulating systems has also been recently demonstrated by some of the authors (Zani et al, 2018).…”
Section: Introductionmentioning
confidence: 92%
“…Specifically, ultrafast SEM monitors light-induced charge dynamics, deriving out-of-equilibrium and hot-charge transport parameters at semiconductor surfaces and pn-junctions. Its application to study charge dynamics in insulating systems has also been recently demonstrated by some of the authors (Zani et al, 2018).…”
Section: Introductionmentioning
confidence: 92%
“…Table 3 shows the hydrogen results from previous studies. The photocatalysts used generally still use Pt, Ni, and Zn metals, while the reaction medium has used biomass such as glycerol, water, rice husks, and olive mill wastewater [31][32][33][34][35]. From previous studies, the highest hydrogen produced was 343 µmol g -1 h -1 using Pt/TiO 2 photocatalyst and the reaction medium in the form of water and olive mill wastewater.…”
Section: Analysis Of Photocatalytic Mechanism Schematicmentioning
confidence: 99%
“…To increase hydrogen production, aluminum foil (AF) is inserted into the BC and FVP photocatalysts. The positively charged AF [32] assists the catalyst to attract oxygen from the water. At the same time, AF also attracts oxygen from the phenolic compound of FVP which had been disturbed and weakened by BC.…”
Section: Introductionmentioning
confidence: 99%
“…Various TR-SEM setups were devised, from the quasisteady-state temporal regime up to ultrafast regime. The latter is usually reached in laser-driven configurations (ultrafast scanning electron microscopy, USEM) based on pulsed electron beams and operated in pump-probe mode [4,7,8,9,10].…”
Section: Introductionmentioning
confidence: 99%