2011
DOI: 10.1016/j.jallcom.2010.12.156
|View full text |Cite
|
Sign up to set email alerts
|

Charge compensation, electrical and dielectric behavior of lanthanum doped CaCu3Ti4O12

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
14
0
2

Year Published

2011
2011
2019
2019

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 57 publications
(17 citation statements)
references
References 22 publications
0
14
0
2
Order By: Relevance
“…The electrical resistivity can be explained on the basis of Verwey-de Boer mechanism in which electron exchange takes place between ions of the same element present in more than one valence state. Such ions are distributed randomly over crystallographically equivalent lattice sites [37].…”
Section: Resistivity Measurementmentioning
confidence: 99%
“…The electrical resistivity can be explained on the basis of Verwey-de Boer mechanism in which electron exchange takes place between ions of the same element present in more than one valence state. Such ions are distributed randomly over crystallographically equivalent lattice sites [37].…”
Section: Resistivity Measurementmentioning
confidence: 99%
“…With rising temperature, defects are activated. Due to Coulombic interaction, positively charged defects attract negatively charged defects leading to the formation of associated defect pairs, jumping of oxygen vacancies around the oxygen octahedron or hopping of holes will facilitate the reorientation of dipoles, which generates dipolar polarization [15][16][17]. A dielectric peak is observed at high temperature.…”
Section: Resultsmentioning
confidence: 99%
“…Por otro lado, la presencia de dipolos en el interior de los granos puede ser explicada a través de la presencia de vacancias de oxígeno que son retenidas dentro del material y de la captura de un electrón por parte del Cu 2+ que lleva a la formación de Cu + . De este modo se forma un par de defectos asociados que es responsable del proceso de relajación observado a las mayores frecuencias [23].…”
Section: Resultados Y Discusiónunclassified
“…Aplicando la ecuación (4) del Modelo de Condensadores de Barreras Internas con t gr =14,08±3,82μm y t b =0,1μm a partir de las imágenes de SEM, ε r =80 [23] y una porosidad V h = 0,08, la constante dieléctrica alcanza un valor de 9.912ε 0 a temperatura ambiente y 1 kHz. En mediciones realizadas en las mismas condiciones, la constante dieléctrica encontrada fue cercana a 16.085ε 0 (Figura 5), por lo que el modelo no logra representar completamente el proceso.…”
Section: Resultados Y Discusiónunclassified