2014
DOI: 10.1016/j.materresbull.2014.08.047
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Characterization of ZnS thin films synthesized through a non-toxic precursors chemical bath

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Cited by 38 publications
(19 citation statements)
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“…Broad diffractions peaks represent the nano‐crystallinity of the films rather than the deposition of amorphous material, as reported previously by several authors . The average crystallite size in the case of ZnS deposition was 9.09 nm and is close to that observed by Man and Lee .…”
Section: Resultssupporting
confidence: 87%
“…Broad diffractions peaks represent the nano‐crystallinity of the films rather than the deposition of amorphous material, as reported previously by several authors . The average crystallite size in the case of ZnS deposition was 9.09 nm and is close to that observed by Man and Lee .…”
Section: Resultssupporting
confidence: 87%
“…MSPLD films are the most stable for annealing treatments with regard to maintaining the c-ZnS to h-ZnS ratio. The band gap values obtained for the films are slightly smaller than the expected band gaps for bulk ZnS (E g = 3.6 eV [60]) and h-ZnS films (E g = 3.91 eV), but comparable to polycrystalline c-ZnS films (E g between 3.29 and 3.79) [61][62][63][64]. Moreover, the as-deposited MS film has a band gap close to the reported value of the amorphous ZnS films (E g = 3.4 eV) [65].…”
Section: Discussioncontrasting
confidence: 56%
“…It was reported by several authors that the peak positions for the wurtzite or sphalerite phases of ZnS thin films shifted from the typical positions. This difference may be proceeding from the lattice expansion or distortion due to the new phases of impurities or intrinsic defects such as vacancies and interstitials [34][35][36][37][38][39]. It was shown in Fig.…”
Section: Resultsmentioning
confidence: 99%