2002
DOI: 10.1007/s00216-002-1488-3
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of thin polymer and biopolymer layers by ellipsometry and evanescent field technology

Abstract: The characterization of sensitive layers is the prerequisite for the optimization of chemical and biochemical sensors. The application of SE (Spectral Ellipsometry) and SPR (Surface Plasmon Resonance) as methods of characterization of such sensitive layers is discussed. In combination with infrared spectroscopy, the properties of polymer networks, micro-porous polymers, liquid crystals, and biomimetic polymers can be examined regarding their applicability for optical sensing. Apart from the basic principles re… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2003
2003
2009
2009

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 15 publications
references
References 13 publications
0
0
0
Order By: Relevance