Characterization of the plastic substrates, the reflective layers, the adhesives, and the grooves of today's archival-grade recordable DVDs

Jiang, Guilin; Rivera, Felipe; Kanyal, Supriya S.; Davis, Robert C.; Vanfleet, Richard; Lunt, Barry M.; Shutthanandan, V.; Linford, Matthew R.

doi:10.1117/1.3529981

Cited by 14 publications

(16 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…1 for He + at higher M S shows that LEIS lacks discrimination/resolution for the heavier elements with this lighter probe. For example, for 3 keV He + at 145 backscattering, the energy difference between 58 Ni and 59 Co is only 10 eV. LEIS also shows little discrimination between 208 Pb and 197 Au under these analysis conditions.…”

Section: Overviewmentioning

confidence: 91%

“…It will illustrate another important conceptconsideration of the different isotopes of elements to be analyzed by LEIS. The discussion above on 58 Ni and 59 Co was true for isotopically pure samples of these elements. However, a real sample of nickel will consist primarily of 58 Ni (68.1%) and 60 Ni (26.2%).…”

Section: Overviewmentioning

confidence: 99%

“…Before going on, let's revisit the discussion of LEIS of 58 Ni and 59 Co. It will illustrate another important conceptconsideration of the different isotopes of elements to be analyzed by LEIS.…”

Section: Overviewmentioning

confidence: 99%

See 2 more Smart Citations

Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications

et al. 2016

View full text Add to dashboard Cite

Section: Overviewmentioning

confidence: 91%

Section: Overviewmentioning

confidence: 99%

See 1 more Smart Citation

Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications

et al. 2016

View full text Add to dashboard Cite

“…4a). This study was part of an in-depth analysis of the reflective layers, the dye, and the glue from this and other archival-grade DVDs (Jiang et al, 2010, 2011).…”

Section: Results Of the Proof-of-concept Tem Analysismentioning

confidence: 99%

Alternative FIB TEM Sample Preparation Method for Cross-Sections of Thin Metal Films Deposited on Polymer Substrates

2013

View full text Add to dashboard Cite

Transmission electron microscopy (TEM) and focused ion beam (FIB) are proven tools to produce site-specific samples in which to study devices from initial processing to causes for failure, as well as investigating the quality, defects, interface layers, etc. However, the use of polymer substrates presents new challenges, in the preparation of suitable site-specific TEM samples, which include sample warping, heating, charging, and melting. In addition to current options that address some of these problems such as cryo FIB, we add an alternative method and FIB sample geometry that address these challenges and produce viable samples suitable for TEM elemental analysis. The key feature to this approach is a larger than usual lift-out block into which small viewing windows are thinned. Significant largely unthinned regions of the block are left between and at the base of the thinned windows. These large unthinned regions supply structural support and thermal reservoirs during the thinning process. As proof-of-concept of this sample preparation method, we also present TEM elemental analysis of various thin metallic films deposited on patterned polycarbonate, lacquer, and poly-di-methyl-siloxane substrates where the pattern (from low- to high-aspect ratio) is preserved.

show abstract

“…We have previously performed SIMS on the materials in our microfabricated TLC plates, including the silica . Other researchers have also been interested in the SIMS of silica.…”

Section: Introductionmentioning

confidence: 99%

Hydroxylation of the silica in microfabricated thin layer chromatography plates as probed by time-of-flight secondary ion mass spectrometry and diffuse reflectance infrared Fourier transform spectroscopy

Kanyal

Singh

Cushman

et al. 2014

Surf. Interface Anal.

View full text Add to dashboard Cite

Microfabricated silica thin layer chromatography (TLC) plates have previously been prepared on patterned carbon nanotube forests. The high temperatures used in their fabrication reduce the number of hydroxyl groups on their surfaces. Fortunately, silica can be rehydroxylated. In diffuse reflectance infrared Fourier transform spectroscopy (DRIFT), a silanol peak below 3740 cm À1 indicates a well-hydroxylated silica surface that is fit for chromatography. Hydroxylations of our materials with HF are so effective that it is not possible to discern the position of this peak. In contrast, this signal is discernable when the plates are treated with NH 4 OH. To find a more convenient method for studying the surfaces of TLC plates, time-of-flight secondary ion mass spectroscopy (ToF-SIMS) was considered. ToF-SIMS is advantageous because multiple microfabricated TLC plates must be scraped to obtain enough silica for one DRIFT analysis, while static SIMS can be performed on very small regions (500 × 500 μm 2 or less) of individual plates. Ratios of the SiOH + and Si + ToF-SIMS signals for microfabricated TLC plates correlated well with~3740 cm À1 silanol peaks from DRIFT. Thus, SIMS allows direct analysis of all of our treated and untreated plates, including those hydroxylated with HF. The best hydroxylation condition for HF, which was better than any studied for NH 4 OH, was around 150 ppm at room temperature. The best hydroxylation condition for NH 4 OH was 50°C for 72 h. ToF-SIMS versus DRIFT results of commercial TLC plates were also obtained and evaluated.

show abstract

Characterization of the plastic substrates, the reflective layers, the adhesives, and the grooves of today's archival-grade recordable DVDs

Cited by 14 publications

References 6 publications

Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications

Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications

Alternative FIB TEM Sample Preparation Method for Cross-Sections of Thin Metal Films Deposited on Polymer Substrates

Hydroxylation of the silica in microfabricated thin layer chromatography plates as probed by time-of-flight secondary ion mass spectrometry and diffuse reflectance infrared Fourier transform spectroscopy

Contact Info

Product

Resources

About