2019
DOI: 10.1016/j.surfcoat.2019.07.071
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of surface modification mechanisms for boron nitride films under plasma exposure

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(1 citation statement)
references
References 106 publications
0
1
0
Order By: Relevance
“…64) Recently, the modification of the surface properties of c-BN films prepared by this system was investigated. 65,66) It was demonstrated that the c-BN films exhibited superior anti-erosion property against plasma exposure. Matsuda et al reported 67) an improved RePAC system for a Si wafer process, where E ion was controlled by an applied RF bias voltage (with a frequency of 400 kHz) and Γ ion by I A supplied from a filament.…”
Section: Introductionmentioning
confidence: 99%
“…64) Recently, the modification of the surface properties of c-BN films prepared by this system was investigated. 65,66) It was demonstrated that the c-BN films exhibited superior anti-erosion property against plasma exposure. Matsuda et al reported 67) an improved RePAC system for a Si wafer process, where E ion was controlled by an applied RF bias voltage (with a frequency of 400 kHz) and Γ ion by I A supplied from a filament.…”
Section: Introductionmentioning
confidence: 99%