2006
DOI: 10.1016/j.surfcoat.2005.11.110
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Characterization of SiO2 thin films prepared by plasma-activated chemical vapour deposition

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Cited by 40 publications
(25 citation statements)
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“…Therefore, the probability of defects in the network increases (free bonds, incorporation of carbon, etc.). This explanation is supported by the investigations of Pfuch et al They observed that SiO 2 -rich coatings deposited using higher power show a larger amount of Si-O-Si bonds [20].…”
Section: Discussionsupporting
confidence: 55%
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“…Therefore, the probability of defects in the network increases (free bonds, incorporation of carbon, etc.). This explanation is supported by the investigations of Pfuch et al They observed that SiO 2 -rich coatings deposited using higher power show a larger amount of Si-O-Si bonds [20].…”
Section: Discussionsupporting
confidence: 55%
“…This mechanism can be understood by the means of a structure model [1,19,20] regarding the variations of cross-linking and defects within the SiO 2 -layers. Using a simplified empirical rate law we obtained dissolution rate constants k + between 10 À13 and 10 À11 mol cm À2 s À1 .…”
Section: Resultsmentioning
confidence: 99%
“…Such shifts have previously been related to various combinations of carbon and oxygen atoms bonded to silicon. Configurations such as Si(O) 1 C 3 , Si(O) 2 C 2 , Si(O) 3 C 1 and Si(O) 4 have been proposed, with the Si(O) 4 configuration showing the highest binding energy for the 2p electrons 20, 27–30. Following this interpretation, we can assume that the films deposited at 60 W input have a higher concentration of Si(O) 1 for which the Si 2p peaks is observed at 102.3 eV.…”
Section: Resultsmentioning
confidence: 85%
“…The growing organic content in the films may also cause a change in the shape of Si-O-Si band around 1040 cm -1 to a broader peak, and shift the peak to lower wavenumbers. [21] It is reasonable to assume that increasing precursor concentration while maintaining a fixed level of electric energy for the activation of the precursor will result in the level of energy gradually becoming insufficient. In our plasma torch system the concentration of HMDSO needed for a complete chemical transformation from HMDSO to SiO 2 was a flow rate of the oxygen carrier gas lower than 100 mL min -1 under an applied voltage of 4.0 kV.…”
Section: Effect Of Carrier Gas Flow Ratementioning
confidence: 99%