Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage

Muddiman, David C.; Brockman, Adam; Proctor, Andrew; Houalla, Marwan; Hercules, David M.

doi:10.1021/j100095a044

Cited by 32 publications

(46 citation statements)

References 3 publications

(3 reference statements)

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“…For detailed statistics, Ag Auger parameters need to be calculated. Unfortunately, the peak position of Ag M4N45N45 Auger peak is around 1130 eV [46] which is outside the range of the detector used in this study (Range: 0-1000 eV). Figure 6c and d present the XPS survey and high-resolution spectra of Au 4f in Gd 2 O 3 @Au system, respectively.…”

Section: Xps Analysis Of Janus-type Gd 2 O 3 Particlesmentioning

confidence: 84%

Asymmetric attachment and functionalization of plasmonic nanoparticles on ceramic interfaces

et al. 2018

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The demands for materials that integrate more than one functional imaging or therapeutic unit are of increasing interest for biomedical applications. Here, we present the step-by-step preparation of asymmetric and optically active particles, namely, Gd 2 O 3 @Ag, Gd 2 O 3 @Au, SiO 2 -N 3 @Au, and SiO 2 -SH@Au . Successful attachment of plasmonic nanoparticles to the surface of metal-oxide spheres without necessity of a potentially toxic inter-adhesive layer was proven by optical methods as well as X-ray photoelectron spectroscopy. The combination of optical and magnetic properties as present in Gd 2 O 3 @ Ag and Gd 2 O 3 @Au Janus-type particles leads to dual-imaging probes for optical and magnetic resonance imaging. In addition, functional groups, such as azide groups, were linked to the surface of silica particles previous to Au nanoparticle attachment. Subsequent site-selective click reactions with 5-FAM were successfully performed as demonstrated by UV-Vis measurements. All described systems exhibited excellent long-term stability and can, therefore, be considered as promising candidates for theranostic applications. Graphical abstract

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Section: Xps Analysis Of Janus-type Gd 2 O 3 Particlesmentioning

confidence: 84%

Asymmetric attachment and functionalization of plasmonic nanoparticles on ceramic interfaces

et al. 2018

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“…Without metallization, the effect of the PS sample concentration on the characteristic secondary ion yields is dramatic and strongly dependent on the chosen projectile type (Figure 2). For atomic projectile bombardment, maximums in the yield versus concentration curves have been already reported for polymers such as PS [11], PMMA [12,26], PVC [12], and for biological films [13]. Norrman et al [12] spin-coated PMMA and PVC on Si wafers using a range of polymer concentrations.…”

Section: Yield Variations As a Function Of The Ps Layer Thicknessmentioning

confidence: 99%

“…The concentration of the spin-coated PS solution was 1 mg/mL and ellipsometric measurements indicate that the layer thickness is in the range 3-4 nm for those samples ( Table 1). The thickness values indicate that for 1 mg/mL, PS forms a monolayer coverage [11,12]. The mass spectra represent the intensity variation of the Au-cationized molecular ion, (M ϩ Au) ϩ , for PS spin-coated on Si and metallized with 0.5 nm Au (a), PS metallized with 6 nm Au (b), and PS spin coated on Au substrate (c).…”

Section: Mass Spectra Of Ps Monolayersmentioning

confidence: 99%

“…Above 2 mg/mL, the yield decreased for both polymers. According to Muddiman et al [11], the secondary ion yields of PS deposited on etched silver increase up to a concentration of about 4 mg/mL, concentration at which the polymer forms a monolayer. Beyond 4 mg/mL, a drastic yield decrease is observed.…”

Section: Yield Variations As a Function Of The Ps Layer Thicknessmentioning

confidence: 99%

“…Moreover, the signal intensities from a given compound are affected by the surface coverage but they are not always proportional to the amount of the compound available at the surface [6, 9 -13]. The characterization of polystyrene oligomers (PS) on etched silver by 10 keV monoatomic Ar ϩ projectiles showed that the maximum yields were obtained when PS was prepared as a monolayer [11]. Other experiments performed with PMMA and PVC polymers led to similar conclusions [12].…”

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Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga⁺ and C₆₀⁺ projectiles

Wehbe

Mouhib

Prabhakaran

et al. 2009

J. Am. Soc. Mass Spectrom.

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This article investigates the influence of the organic film thickness on the characteristic and molecular ion yields of polystyrene (PS), in combination with two different substrates (Si, Au) or gold condensation (MetA-SIMS), and for atomic (Ga ϩ ) and polyatomic (C 60 ϩ ) projectile bombardment. PS oligomer (m/z ϳ 2000 Da) layers were prepared with various thicknesses ranging from 1 up to 45 nm on both substrates. Pristine samples on Si were also metallized by evaporating gold with three different thicknesses (0.5, 2, and 6 nm). Secondary ion mass spectrometry was performed using 12 keV atomic Ga ϩ and C 60 ϩ projectiles. The results show that upon Ga ϩ bombardment, the yield of the fingerprint fragment C 7 H 7 ϩ increases as the PS coverage increases and reaches its maximum for a thickness that corresponds to a complete monolayer (ϳ3.5 nm). Beyond the maximum, the yields decrease strongly and become constant for layers thicker than 12 nm. In contrast, upon C 60 ϩ bombardment, the C 7 H 7 ϩ yields increase up to the monolayer coverage and they remain constant for higher thicknesses. A strong yield enhancement is confirmed upon Ga ϩ analysis of gold-metallized layers but yields decrease continuously with the gold coverage for C 60 ϩ bombardment. Upon Ga ϩ bombardment, the maximum PS fingerprint ion yields are obtained using a monolayer spin-coated on gold, whereas for C 60 ϩ , the best results are obtained with at least one monolayer, irrespective of the substrate and without any other treatment. The different behaviors are tentatively explained by arguments involving the different energy deposition mechanisms of both projectiles. (J Am Soc

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Improvement of signal intensities in static secondary-ion mass spectrometry using halide additives and substrate modification

1998

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A new approach is reported for secondary‐ion time‐of‐flight mass spectrometry (TOF‐SIMS) sample preparation. The method involves the use of halide additives or halide modification of silver substrate surfaces to promote analyte cationization and protonation. The enhancement of signal intensity has been demonstrated for neutral organic lipophilic and hydrophilic compounds including various small peptides and nucleosides. Improvement factors range from 2–30 for cationized species to 20–2000 for protonated species. However, the new sample preparation does not affect the signal intensities of preformed ionic species. The sample preparation approach is applicable to a wide variety of neutral compounds and should find broad use for organic analysis by TOF‐SIMS. © 1998 John Wiley & Sons, Ltd.

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Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage

Cited by 32 publications

References 3 publications

Asymmetric attachment and functionalization of plasmonic nanoparticles on ceramic interfaces

Asymmetric attachment and functionalization of plasmonic nanoparticles on ceramic interfaces

Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga⁺ and C₆₀⁺ projectiles

Improvement of signal intensities in static secondary-ion mass spectrometry using halide additives and substrate modification

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Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage

Cited by 32 publications

References 3 publications

Asymmetric attachment and functionalization of plasmonic nanoparticles on ceramic interfaces

Asymmetric attachment and functionalization of plasmonic nanoparticles on ceramic interfaces

Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles

Improvement of signal intensities in static secondary-ion mass spectrometry using halide additives and substrate modification

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Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga⁺ and C₆₀⁺ projectiles