2013
DOI: 10.1088/1742-6596/425/6/062015
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Characterization of photon counting pixel detectors based on semi-insulating GaAs sensor material

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Cited by 23 publications
(31 citation statements)
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“…The resistivity was measured to be cm in the linear range, which is in agreement with previous measurements carried out using the same batch of material [23].…”
Section: A Detector Characterizationsupporting
confidence: 89%
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“…The resistivity was measured to be cm in the linear range, which is in agreement with previous measurements carried out using the same batch of material [23].…”
Section: A Detector Characterizationsupporting
confidence: 89%
“…This technique previously demonstrated to provide sensors with resistivities in the order of cm [23], [28], [29] via high compensation rates. Due to the high dopant concentration, the width of the space charge regions (SCR) behind the metal (Schottky) contacts are small, leading to the bias voltage dropping mainly across the sensor and thus to a uniform distribution of the electric field [21], [24], [30].…”
Section: Detector Fabrication and Chip Descriptionmentioning
confidence: 99%
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“…As discussed earlier [1][2][3][4], gallium arsenide compensated with chromium is a promising material for semiconductor detectors with X-ray photon energies ranging from 15 to 60 keV. The results of investigations on the variations in the pulse height distribution with the electrophysical characteristics of the detector material and in the output signal (photocurrent and count rate) with the X-ray intensity and bias voltage are presented.…”
Section: Contentsmentioning
confidence: 97%
“…The prototypes were compatible with Medipix 3/Timepix readout ASICs. The GaAs:Cr sensors were bump-bonded to Medipix/Timepix ASICs and tested at the FMF and IPS [4]. Images were obtained using a 512 × 768 pixel GaAs sensor (see figures 8(a) and (b)).…”
Section: Prototype Gaas:cr Imaging Detectorsmentioning
confidence: 99%