2020
DOI: 10.1002/crat.202000021
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Overview of GaAs und CdTe Pixel Detectors Using Medipix Electronics

Abstract: GaAs and CdTe pixel detectors have been developed over the last few decades. The applications of these detectors include X‐ and gamma‐ray detectors working at room temperature. Fundamental properties such as detection efficiency and noise are determined by the material properties of the sensor material. Different materials have been evaluated over the years in search of the best choice for different types of radiation. This article describes the properties of GaAs and CdTe materials for single photon processin… Show more

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Cited by 22 publications
(12 citation statements)
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“…For a semiconductor to serve as an X-ray detector with characteristics approaching ideal performance, several requirements must be fulfilled: high resistivity (≤10 10 Ω cm) and hence sufficiently low noise levels for resolving charges generated by a single photon, high carrier mobility-lifetime (µτ) product for the efficient collection of photon-generated carriers, and absorption of (nearly) all X-ray photons-the latter scales with the thickness and the average atomic number (Z) of constituting elements. Very few high-Z semiconductors were proposed to fulfill these requirements at room temperature 6,14,15,16,17 and thus far, only costly, ultrapure CdTe and CdZnTe single crystals, usually grown from a melt by high-pressure Bridgman or by Czochralski methods, have been commercially deployed 18,19 . Lead halide perovskite semiconductors (general formula APbX3, where A is a cation, either organic methylammonium (MA + ) or formamidinium, or inorganic Cs + ; and X is an anion of I, Br or Cl halogen) are the most intensely studied class of contender high-Z materials for high-energy photon detection 3,4,5,6,7,12,13,20,21,22,23,24,25,26,27,28 .…”
mentioning
confidence: 99%
“…For a semiconductor to serve as an X-ray detector with characteristics approaching ideal performance, several requirements must be fulfilled: high resistivity (≤10 10 Ω cm) and hence sufficiently low noise levels for resolving charges generated by a single photon, high carrier mobility-lifetime (µτ) product for the efficient collection of photon-generated carriers, and absorption of (nearly) all X-ray photons-the latter scales with the thickness and the average atomic number (Z) of constituting elements. Very few high-Z semiconductors were proposed to fulfill these requirements at room temperature 6,14,15,16,17 and thus far, only costly, ultrapure CdTe and CdZnTe single crystals, usually grown from a melt by high-pressure Bridgman or by Czochralski methods, have been commercially deployed 18,19 . Lead halide perovskite semiconductors (general formula APbX3, where A is a cation, either organic methylammonium (MA + ) or formamidinium, or inorganic Cs + ; and X is an anion of I, Br or Cl halogen) are the most intensely studied class of contender high-Z materials for high-energy photon detection 3,4,5,6,7,12,13,20,21,22,23,24,25,26,27,28 .…”
mentioning
confidence: 99%
“…In parallel, a lot of effort is currently being invested in direct detectors based on high-Z materials, e.g. based on AsGa and CdTe (Pennicard et al, 2018;Brombal et al, 2018;Fiederle et al, 2020). However, the decisive advantage of indirect detectors is to offer a very uniform and easily scalable field of view at a reasonable cost.…”
Section: Discussionmentioning
confidence: 99%
“…The minimum threshold limit depends on the type and thickness of the used detection layer material and the internal noise of the ASIC chip. Typical detection layers can be Silicon (Si), Cadmium Telluride (CdTe), or Gallium Arsenide (GaAs) in various thicknesses [ 31 , 32 ]. For the Si detection layer, which was used in the presented work, the minimum threshold value is as low as 2 keV [ 33 ].…”
Section: Methodsmentioning
confidence: 99%