2005
DOI: 10.1016/j.jeurceramsoc.2005.03.044
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Characterization of optical properties of nanocrystalline doped PZT thin films

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Cited by 14 publications
(12 citation statements)
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References 14 publications
(14 reference statements)
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“…Increase in refractive index with the reduction of thickness for PZTNi30 thin films can be due to the increase in crystallinity and grain size. 48,49 Monotonic decrease in the k values is seen for both films, especially for 400 nm, with the variation of wavelength matching well with the earlier reported behavior of PZT thin films. 43 The total optical loss caused by absorption and scattering Àk values is observed to be low for the PZTNi30 films of thickness 400 nm.…”
Section: Optical Characterizationsupporting
confidence: 86%
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“…Increase in refractive index with the reduction of thickness for PZTNi30 thin films can be due to the increase in crystallinity and grain size. 48,49 Monotonic decrease in the k values is seen for both films, especially for 400 nm, with the variation of wavelength matching well with the earlier reported behavior of PZT thin films. 43 The total optical loss caused by absorption and scattering Àk values is observed to be low for the PZTNi30 films of thickness 400 nm.…”
Section: Optical Characterizationsupporting
confidence: 86%
“…Hu et al 48 observed the decreases in refractive index with increasing thickness in the wavelength range 2.5-11 lm for the BST films. Lappalainen et al 49 found that the refractive index varied from 2.28 to 2.46 with the increase of mean grain size for Nd-doped PZT thin films. Increase in refractive index with the reduction of thickness for PZTNi30 thin films can be due to the increase in crystallinity and grain size.…”
Section: Optical Characterizationmentioning
confidence: 99%
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“…Unfortunately the Lorentz oscillator (LO) does not fit well the characteristics of the complex dielectric function at the near ultraviolet and ultraviolet (UV) regions for ferroelectrics and some semiconductors (Bungay and Tiwald, 2004;Jellison et al, 1997;Synowicki and Tiwald, 2004). LO functions were used to model molecular or lattice vibrations in the infrared (Bungay and Tiwald, 2004), complex refractive index of conductive oxides (Synowicki, 1998), metals (Brevnov and Bungay, 2005), and ferroelectrics till the absorption edge (Lappalainen et al, 2005). LO is symmetric in shape, and the high and low energy sides of the function decrease at the same rate.…”
Section: What Ellipsometry Measures?mentioning
confidence: 99%
“…Among these materials, lead zirconate titanate (PZT) has received great attention because of its ferroelectric and piezoelectric properties, coupled to high optical transmittance, low reflectance and strong electro-optic Kerr effect [4].…”
Section: Thermal Induced Changes Of Lead Zirconium Titanate Films Andmentioning
confidence: 99%