2015
DOI: 10.1063/1.4913537
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Characterization of N-doped multilayer graphene grown on 4H-SiC (0001)

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“…The graphene layers were grown in a closed RF induction furnace at a temperature of about 1550 °C at 10 −5 mbar. Eight to 10 layers determined by STEM analysis were intentionally chosen to fabricate the devices [3,26]. Following the growth, Raman spectroscopy experiments were carried out to evaluate the integrity of the graphene material.…”
Section: Methodsmentioning
confidence: 99%
“…The graphene layers were grown in a closed RF induction furnace at a temperature of about 1550 °C at 10 −5 mbar. Eight to 10 layers determined by STEM analysis were intentionally chosen to fabricate the devices [3,26]. Following the growth, Raman spectroscopy experiments were carried out to evaluate the integrity of the graphene material.…”
Section: Methodsmentioning
confidence: 99%