Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses

Senthilkumar, M.; Sahoo, N. K.; Thakur, S.; Tokas, R.B.

doi:10.1016/j.apsusc.2005.02.122

Cited by 105 publications

(88 citation statements)

References 15 publications

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“…''K correlation'' or ''ABC Model'' [30][31][32][33] Structure present at a larger dimensional scale, such as grain size in the present case, may be superimposed on small-scale structure. Such structure has been described in cluster ion beam polishing and in thin film growth [22]. The PSD of such a model is described by…”

Section: Fractal Structure Modelmentioning

confidence: 99%

“…Researchers [22,26,27] in the optics and microelectronics communities applying PSD analysis have noticed characteristic patterns associated with frequently occurring topographies. For example, a 90 sharp step gives a PSD having the form K=f 2 , a straight line of slope À2 in log-log coordinates.…”

Section: Components Analysismentioning

confidence: 99%

“…Experience in the optics and semiconductor communities indicates that a suitable approach is to remove a two-dimensional third order polynomial from each record before further analysis [18,22]. Such an approach is promising for relatively smooth surfaces (EP), but major sharp surface steps (BCP) may need to be individually removed-''destepping.…”

Section: B Power Spectral Density (Psd) Data Analysismentioning

confidence: 99%

“…In contrast, PSD data obtained from electropolished materials typically do not exhibit straight lines on a log/log plot but display two regions of strong curvature, as will be seen later. More generally, the PSD of a niobium surface prepared by various methods can be fruitfully decomposed into contributions from each of these types of models [22,26,[35][36][37]:…”

Section: B Shifted-gaussian Model [34]mentioning

confidence: 99%

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Enhanced characterization of niobium surface topography

Chang

Tian

Reece

et al. 2011

Phys. Rev. ST Accel. Beams

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Surface topography characterization is a continuing issue for the superconducting radio frequency (SRF) particle accelerator community. Efforts are under way to both improve surface topography and its characterization and analysis using various techniques. In measurement of topography, power spectral density (PSD) is a promising method to quantify typical surface parameters and develop scale-specific interpretations. PSD can also be used to indicate how the process modifies topography at different scales. However, generating an accurate and meaningful topographic PSD of an SRF surface requires careful analysis and optimization. In this report, niobium surfaces with different process histories are sampled with atomic force microscopy and stylus profilometry and analyzed to trace topography evolution at different scales. An optimized PSD analysis protocol to serve SRF needs is presented.

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Section: Fractal Structure Modelmentioning

confidence: 99%

Section: Components Analysismentioning

confidence: 99%

Section: B Power Spectral Density (Psd) Data Analysismentioning

confidence: 99%

Section: B Shifted-gaussian Model [34]mentioning

confidence: 99%

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Enhanced characterization of niobium surface topography

Chang

Tian

Reece

et al. 2011

Phys. Rev. ST Accel. Beams

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“…65 Here we have adopted the definition used previously for the 2-D PSD of a surface described by its topography z (x; y). 65,66 As before, 63 the AFM scan data were detrended by removing a least squares two dimensional first order polynomial from each record before further analysis. In this study, the PSD profiles that were measured at different locations under the same scan condition were averaged separately.…”

Section: Surface Roughness Measurementmentioning

confidence: 99%

Laser Processing of Metals and Polymers

Singaravelu

2012

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A laser offers a unique set of opportunities for precise delivery of high quality coherent energy. This energy can be tailored to alter the properties of material allowing a very flexible adjustment of the interaction that can lead to melting, vaporization, or just surface modification. Nowadays laser systems can be found in nearly all branches of research and industry for numerous applications. Sufficient evidence exists in the literature to suggest that further advancements in the field of laser material processing will rely significantly on the development of new process schemes. As a result they can be applied in various applications starting from fundamental research on systems, materials and processes performed on a scientific and technical basis for the industrial needs. The interaction of intense laser radiation with solid surfaces has extensively been studied for many years, in part, for development of possible applications. In this thesis, I present several applications of laser processing of metals and polymers including polishing niobium surface, producing a superconducting phase niobium nitride and depositing thin films of niobium nitride and organic material (cyclic olefin copolymer).The treated materials were examined by scanning electron microscopy (SEM), electron probe microanalysis (EPMA), atomic force microscopy (AFM), high resolution optical microscopy, surface profilometry, Fourier transform infrared spectroscopy (FTIR) and x-ray diffraction (XRD). Power spectral density (PSD) spectra computed from AFM data gives further insight into the effect of laser melting on the topography of the treated niobium. I owe my deepest gratitude to Dr. J. Michael Klopf from FEL team, who was beside me supporting my experiments. Any discussion I had with him has always been informative and helpful. Thanks for his encouragement and patience. He faced the challenge of a demanding student as I was. Eventually my progress will inspire many more research students to seek his fortunate advice and guidance. I wish to thank Dr. Shukui Zhang from FEL team for training and teaching me the laser system. I can never forget the timely help rendered by Dr. Gwyn Williams, Dr. Steve Benson, Dr. Jim Coleman, Cody Dickover, Chris Gould, Joe Gubeli, Kevin Jordan, Jim Kortze, Dan Sexton, Dr. Michelle Shinn, Dr. Richard Walker, Tom Powers and Guy Wilson, during my stay in FEL building by providing all the help I requested for.

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