1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record
DOI: 10.1109/nssmic.1995.504317
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Characterization of double-sided silicon strip detector with fast binary readout electronics using pion beams

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Cited by 5 publications
(6 citation statements)
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“…We have also measured an irradiated detector to 0018-9499/96$05.00 0 1996 IEEE -assess the performance. subsequent beam test [7].…”
Section: Methods Of Noise Determinationmentioning
confidence: 99%
“…We have also measured an irradiated detector to 0018-9499/96$05.00 0 1996 IEEE -assess the performance. subsequent beam test [7].…”
Section: Methods Of Noise Determinationmentioning
confidence: 99%
“…We also report on the results of a beam test [8] carried out at KEK in 1996. Previous beam tests at KEK [5] have shown low noise occupancy at the nominal threshold of 1 fC and good efficiency, even at higher thresholds. In the H8 beamtest, the use of a beam telescope with a resolution of a few microns allowed the investigation of the efficiency at a fine scale as a function of the interstrip distance.…”
Section: Introductionmentioning
confidence: 91%
“…Thus the pulse height is not directly available during data taking. It has been shown [4,5] that the distribution of pulse heights can be recovered by varying the threshold and measuring the counting rate, which is the integral of the pulse height spectrum. Likewise, the noise can be determined from threshold scans without beams.…”
Section: Introductionmentioning
confidence: 99%
“…It was reported in Refs. [3,4] that a ND-YAG laser system was used to measure the charge sharing between nearby strips in the silicon micro-strip detectors for the ATLAS experiment. Inspired by such measurements, a compact system based on a low-power semiconductor laser device has been developed for characterize the SOI pixel detector.…”
Section: Introductionmentioning
confidence: 99%
“…Inspired by such measurements, a compact system based on a low-power semiconductor laser device has been developed for characterize the SOI pixel detector. It should be pointed out that for the silicon micro-strip detectors tested in Refs [3,4], only a small fraction of the infrared photons were reflected or blocked by the aluminium on top of the detector surface. For silicon pixel detectors, however, the surfaces are typically covered by the aluminium path of the readout circuits or metal dummy [5], which can prevent almost completely the infrared photons penetrating through the detector bulk.…”
Section: Introductionmentioning
confidence: 99%