2011
DOI: 10.1007/s10894-011-9406-3
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Characterization of Diamond: Like Carbon Films Synthesized by DC-Plasma Enhanced Chemical Vapor Deposition

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Cited by 26 publications
(8 citation statements)
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“…The Raman spectra of as grown NCDs on the Si substrate show the three important peaks, as shown in figure 2. The peaks at 1388 and 1571 cm -1 are related to D and G bands (Paul 2008;Hsu et al 2010;Vaghri et al 2011;Huang et al 2012). Whereas the D band for the NCD deposited on the Si substrate appeared at a low wavenumber at 1345 cm -1 , also the G peak position shifted to a lower wavenumber at 1517 cm -1 .…”
Section: Resultsmentioning
confidence: 98%
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“…The Raman spectra of as grown NCDs on the Si substrate show the three important peaks, as shown in figure 2. The peaks at 1388 and 1571 cm -1 are related to D and G bands (Paul 2008;Hsu et al 2010;Vaghri et al 2011;Huang et al 2012). Whereas the D band for the NCD deposited on the Si substrate appeared at a low wavenumber at 1345 cm -1 , also the G peak position shifted to a lower wavenumber at 1517 cm -1 .…”
Section: Resultsmentioning
confidence: 98%
“…SiC nanomaterials have been successfully synthesized using a number of methods including decomposition of organic silicon compounds, high temperature reactions between carbon nanotubes and SiO, arc-discharge processes, hot filament chemical vapour deposition and lowtemperature, atmospheric microplasma deposition (Zhou et al 2000;Xu et al 2005;Wang 2007;Qamar et al 2011;Vaghri et al 2011). In addition, these techniques are very complex, slow and harmful because of the use of the highly toxic precursor, silane.…”
Section: Introductionmentioning
confidence: 99%
“…The increase in relative intensity of the Ag diffraction peaks in ratio of Ar/CH 4 1 : 2 can be attributed to the increase of amount of silver nanoparticles sputtered on substrate in ratio of Ar/CH 4 1 : 2 which may result in the increase in diffracted photon counts if X-Ray can still penetrate up to the increased depth of silver crystalline layer. The average crystallite size is estimated using Scherer formula [21]:…”
Section: Xrd Resultsmentioning
confidence: 99%
“…The Ag/C:H thin films are prepared by DC sputtering. A detail of this system has been reported in [21]. The glow discharge was powered by DC power supply in regime of constant current.…”
Section: Methodsmentioning
confidence: 99%
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