2002
DOI: 10.1016/s0040-6090(02)00249-3
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of Cu-poor surface on Cu-rich CuInSe2 film prepared by evaporating binary selenide compounds and its effect on solar efficiency

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
2
0

Year Published

2007
2007
2020
2020

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 14 publications
(5 citation statements)
references
References 16 publications
0
2
0
Order By: Relevance
“…Compared with CIGS sample without OVC, there was an additional XRD peak at 35.81° for incident angles below 0.4 o , which represented the Cu(In,Ga) 3 Se 5 OVC phase(Figure S6c,d, Supporting Information). [ 27,28 ] In the OVC system, there are various crystal structures such as Cu(In,Ga) 4 Se 7 , Cu(In,Ga) 3 Se 5 , and Cu(In,Ga) 5 Se 8 . [ 13 ] And the obtained OVC composition is depending on the growth temperature and the amount of source material.…”
Section: Resultsmentioning
confidence: 99%
“…Compared with CIGS sample without OVC, there was an additional XRD peak at 35.81° for incident angles below 0.4 o , which represented the Cu(In,Ga) 3 Se 5 OVC phase(Figure S6c,d, Supporting Information). [ 27,28 ] In the OVC system, there are various crystal structures such as Cu(In,Ga) 4 Se 7 , Cu(In,Ga) 3 Se 5 , and Cu(In,Ga) 5 Se 8 . [ 13 ] And the obtained OVC composition is depending on the growth temperature and the amount of source material.…”
Section: Resultsmentioning
confidence: 99%
“…(Because of the standard-less measurement mode of AES and the porous nature of the bottom layer, the AES depth profile was considered only semiquantitatively in this work.) The presence of OVC phase is postulated to cause a rather positive effect on the device performance due to its hole-blocking nature, which intern reduces surface recombination. , The Cu enrichment in CRL will be addressed more in detail when the growth mechanism of the CISe film is discussed. The carbon in the bottom CRL was found to exist in the amorphous state as evidenced by XRD pattern of the same sample in which no carbide peaks were detected (Figure S1 in the Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…In the third stage, In, Cu, and Se sources were co-evaporated on the CIGS films to remove the Cu 2 Se secondary phase. The overall composition was controlled by adjusting the deposition time and evaporation rates and was confirmed by AES analysis [3,4]. The overall thickness of the film was about 2 µm.…”
Section: Methodsmentioning
confidence: 94%
“…The ZnO window layer was deposited by rf magnetron sputtering and it consisted of i-ZnO(50 nm) and n-ZnO(1 µm). The resistivities of the i-ZnO and n-ZnO layers were ~10 6 and 5x10 -4 ΩOcm, respectively [3,4].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation