Characterization of a picosecond gated optical intensifier

Abstract

The development of high speed imaging detectors is crucial for high-temperature plasma characterization and optimization. These detectors must perform within many strict parameters, such as precise timing, high spatial resolution, low noise, high gain, and fast gating. We present test results on a picosecond gated optical intensifier that aims to meet these requirements. The detector was developed by Kentech and is part of a packaged Sydor solution of 1-8 detectors, designed for use in plasma diagnostics. It has low jitter (SD 4 ps) and gate widths less than 80 ps. We use a pulsed laser to test the gate profile and the spatial resolution performance of the intensifier at different points within the gate.

Ultrafast High Voltage Pulse Generator Based on Power MOSFETs Delay Push-pull Structure

“…Image intensifier has wide applications in low-light-level night vision, single particle detection, and high-speed photography [1][2][3]. The proximity focus image intensifier is mainly composed of a photocathode, a Microchannel Plate (MCP), and a fluorescent screen, which can realize the functions of photoelectric conversion, electron energy enhancement, and electro-optical conversion, respectively [4][5][6][7].…”