2010
DOI: 10.1117/12.860816
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Characterization of a parallel aligned liquid crystal on silicon and its application on a Shack-Hartmann sensor

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Cited by 8 publications
(10 citation statements)
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“…To conduct the LCoS display surface calibration, a digital micro-lens array pattern (Shack-Hartmann scheme [19,20]) is self-addressed to the device. The micro-lens array consists of an ordered lattice of micro diffractive convergent lenses integrated at the LCoS plane.…”
Section: Surface Profile Calibrationmentioning
confidence: 99%
See 1 more Smart Citation
“…To conduct the LCoS display surface calibration, a digital micro-lens array pattern (Shack-Hartmann scheme [19,20]) is self-addressed to the device. The micro-lens array consists of an ordered lattice of micro diffractive convergent lenses integrated at the LCoS plane.…”
Section: Surface Profile Calibrationmentioning
confidence: 99%
“…Here, the term "self-addressing" means that the used DOEs are addressed to the same LCoS display to be calibrated, this leading to an auto-calibrating procedure. In particular, two DOEs are self-addressed: (1) a split-lens configuration [17,18] to fulfil the phase-voltage calibration; and (2) a spot-array pattern (Shack-Hartmann, S-H, configuration [19][20][21]) to realize the surface profile measurement. For the phase-voltage calibration case, a diffractive two split-lens configuration is addressed on the LCoS, which is illuminated by coherent light.…”
Section: Introductionmentioning
confidence: 99%
“…However, if the input wavafront carries some aberrations, the light spots on the focal plane present certain offset displacements from their ideal spots. Thus, by measuring the displacements of each focal point from their ideal positions, the input wavefront can be retrieved by implementing proper numerical algorithms [37][38][39].…”
Section: Self-calibration Of the Lcos Screen Surface By Using A Micromentioning
confidence: 99%
“…Numbers of LCoS self-calibration methods, both optimize the phase-voltage relation and the surface phase inhomogeneity, are proposed in literatures [27,29]. Among them, interferometry [30,31] or diffraction [32,33] based methods are demonstrated suitable for the phase-voltage calibration, and the Shack-Hartmann pattern [34,35] meets the requirement to imply the surface inhomogeneity calibration.…”
Section: Introductionmentioning
confidence: 99%