Characterization of a 1 mm (DC to 110 GHz) Calibration Kit for VNA

Cho, Chihyun; Kang, Jungmin; Lee, Joo-Gwang; Koo, Hyunji

doi:10.26866/jees.2019.19.4.272

Cited by 8 publications

(13 citation statements)

References 7 publications

(8 reference statements)

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“…All the data described are based on the same OSL calibration ensuring a fair comparison between the presented de-embedding methods. An alternative solution to the performed process is based on the replacement of the open and load with two additional offset shorts [54, 55]. The three-offset shorts (SSS) approach is capable of achieving single port calibration on transmission media where it is difficult to realize loads or opens.…”

Section: Physical Properties and S-parameter Measurements Of Utc-pdsmentioning

confidence: 99%

Investigation of de-embedding techniques applied on uni-traveling carrier photodiodes

Konstantinou

Caillaud

Rommel

et al. 2021

Int. J. Microw. Wireless Technol.

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The generation and transmission of millimeter-wave signals for 5G applications require the use of broadband and high output power photodetectors to bridge from the optical and electronic domains. Therefore, the deep knowledge on the equivalent circuit characteristics of these devices is vital. This study reviews and analyzes de-embedding techniques contributing to the characterization of the physical aspects within the active region of uni-traveling carrier photodiodes. De-embedding methods analytically remove the parasitic effects of the electrical transmission lines connected to their active area allowing the extraction of their series resistance and junction capacitance toward the synthesis of an equivalent circuit with lumped elements. The open-short technique is examined and a systematic error introduced by this process underlines the vulnerability of the method on removing parasitics with higher complexity. This error is quantified leading to the implementation of a corrected equation converging with the characteristic features of an $S$ -parameter-based de-embedding. These characteristics are also analyzed through simulation approaches showing minimal equivalent inaccuracies on eliminating more complex symmetrical parasitics. A thorough comparison between these three methods is conducted through the calculation of lumped components corresponding to the active region of diodes with different sizes.

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Section: Physical Properties and S-parameter Measurements Of Utc-pdsmentioning

confidence: 99%

Investigation of de-embedding techniques applied on uni-traveling carrier photodiodes

Konstantinou

Caillaud

Rommel

et al. 2021

Int. J. Microw. Wireless Technol.

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“…The measurement uncertainty of the RF comb generator can be estimated from each covariance of the measured pulse S pulse , the frequency response of the oscilloscope S H , the adapter impedance S Sxx , the reflection coefficient of the comb S Gcomb , the reflection coefficient of the oscilloscope S Gscope , and the repeat measurement S repet as follows: the covariance S pulse can be obtained during the nonlinear optimization using equation ( 1), which is found in detail in Hale et al 9 and Cho et al; 10 the covariance S H can be found in Cho et al 5 as explained in the previous section; and finally, the covariances S Sxx , S Gcomb , and S Gscope are obtained from the physical parameters of the cal kit (Table 1) 14,15 through the impedance calibration process 16 S phase = J pulse S pulse J 0 pulse + J H S H J 0…”

Section: Analysis Of the Measurement Uncertaintymentioning

confidence: 99%

Phase calibration and uncertainty evaluation for a RF comb generator

Cho

Koo

Kwon

et al. 2020

Measurement and Control

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In this paper, we present calibration and uncertainty evaluation methods for the phase of a radio-frequency comb generator using a calibrated sampling oscilloscope. In addition, we present many solutions that are indispensable for the precise calibration of phase up to 50 GHz. First, we correct the sampling time error, which is the systematic error of the equivalent time sampling system. Second, the frequency response of the oscilloscope is de-convoluted from the measured pulse, and the impedance mismatch between the radio-frequency comb generator and the oscilloscope is calibrated. Finally, we present the calibrated phase of the radio-frequency comb generator and the measurement uncertainty, which demonstrated 95% confidence intervals within ±4.4° up to 50 GHz. The calibrated radio-frequency comb generator, which is traceable to SI units, is used to calibrate a nonlinear vector network analyzer, vector signal analyzer, and oscilloscope. Uncertainties are easily propagated to the measurement uncertainty of other apparatus since it is obtained in the form of covariance.

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“…scope and PD are the reflection coefficients of the RTDO and the PD, and S xx is the S parameters of the adapter. The impedance of the adapter, source, and PD was measured using a vector network analyzer (VNA), and the measurement uncertainty was analyzed based on the physical parameters [8], [9]. Therefore, the full covariance between not only real and imaginary values but also all frequency values can be obtained and it can be converted from the frequency domain to the time domain and vice versa [10].…”

Section: E Calibration Of Impedance Mismatchmentioning

confidence: 99%

“…where σ represents the standard deviation of the variables. Generalizing (9) to the matrix form can be expressed as the product of the Jacobian matrix and the covariance matrix [13]. Thus t is propagated to the covariance of the measured pulse align as follows:…”

Section: A Uncertainty Of the Measured Pulse Using The Rtdomentioning

confidence: 99%

Uncertainty Analysis for Characterization of a Commercial Real-Time Oscilloscope Using a Calibrated Pulse Standard

et al. 2019

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In this paper, we describe a traceable measurement method for the frequency response of commercial real-time digital oscilloscopes (RTDOs). Since the commercial RTDOs usually use multiple analog digital convertors (ADCs), it is very challenging to characterize each ADC without having access to the internal circuitry. In this study, we use an additional continuous wave (CW) source to match the sampling sequence in a time interleaved ADC (TIADC). We also use a calibrated pulse standard traceable to the National Institute of Standards and Technology (NIST). Since the sampling rate of a single ADC is greatly reduced, we slightly misalign the sampling rate of the pulse and the single ADC and then stack the multiple measured pulses as a single pulse. As a result, the sampling rate can be greatly increased by about 8000 times. The frequency response of the RTDO during testing shows a variation of ±1 dB in amplitude and ±7 • in phase between ADCs at the maximum operating frequency. These differences need to be calibrated as they cause systematic errors in the measurement. The 95% confidence interval of the measured frequency response is about 0.2 dB in amplitude and 3 • in phase. Finally, the measured amplitude is compared with the swept sine measurement method, which confirms that they agree well within its uncertainties. INDEX TERMS Oscilloscopes, real time systems, calibration, frequency response, metrology, measurement uncertainty.

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Characterization of a 1 mm (DC to 110 GHz) Calibration Kit for VNA

Cited by 8 publications

References 7 publications

Investigation of de-embedding techniques applied on uni-traveling carrier photodiodes

Investigation of de-embedding techniques applied on uni-traveling carrier photodiodes

Phase calibration and uncertainty evaluation for a RF comb generator

Uncertainty Analysis for Characterization of a Commercial Real-Time Oscilloscope Using a Calibrated Pulse Standard

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