Characteristics of the MFIS structure fabricated with the LSMCD-DERIVED SBT thin film and TiO<sub>2</sub>buffer layer

Park, Joo Dong; Kim, Ji Woong; Oh, Tae-Sung

doi:10.1080/00150190108016031

Cited by 2 publications

(2 citation statements)

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“…We thus concluded that this effect is predominantly due to a phase error of the measurements in the cryostat and we did not take it into account during the fitting procedure. One can see from figure 1 that the contribution of all polar phonons to the static permittivity is only about 100, although it is well known that the low-frequency permittivity is usually higher than 150 at RT [4,5,26]. We note that the thickness dependence of ε in SBT thin film was observed only below 200 nm [26], which is much less than the 5.5 µm that we used.…”

Section: Resultsmentioning

confidence: 55%

“…One can see from figure 1 that the contribution of all polar phonons to the static permittivity is only about 100, although it is well known that the low-frequency permittivity is usually higher than 150 at RT [4,5,26]. We note that the thickness dependence of ε in SBT thin film was observed only below 200 nm [26], which is much less than the 5.5 µm that we used. Therefore we assume that the permittivity of our film agrees with that of the bulk samples.…”

Section: Resultsmentioning

confidence: 55%

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The ferroelectric soft mode and central mode in SrBi₂Ta₂O₉films

Kempa

Kužel

Kamba

et al. 2003

J. Phys.: Condens. Matter

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The dynamics of the ferroelectric phase transition in a SrBi 2 Ta 2 O 9 film of 5.5 µm thickness deposited on sapphire was studied by means of timedomain terahertz transmission spectroscopy (30-300 K) and Fourier transform far-infrared transmission spectroscopy (300-950 K). The optical soft mode near 28 cm −1 (at 300 K) exhibits a weak monotonic softening down to 20 cm −1 at 950 K with no significant anomaly near either the ferroelectric or ferroelastic phase transition. An additional relaxation process below the phonon frequencies was resolved in the terahertz transmission spectra. The critical slowing down of its relaxation frequency could be responsible for the dielectric anomaly near the ferroelectric transition temperature. This indicates that the ferroelectric transition is predominantly of order-disorder type.

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