2016
DOI: 10.1016/j.carbon.2015.09.101
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Characteristics of industrially manufactured amorphous hydrogenated carbon (a-C:H) depositions on high-density polyethylene

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Cited by 45 publications
(99 citation statements)
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“…As shown in Figure , the first treatment induced no relevant change to the G, 2D Raman bands apart from a small decrease of their intensity ratio from 2.8 down to 2.0. The successive vacuum treatment up to 18.5 h gives a blue shift of the two bands, some further reduction of their intensity ratio and the appearance of a large unresolved signal below the G band that can be associated to some amorphous carbon contribution arising from residual PMMA carbonization . The treatment of a sample in CO 2 atmosphere gives again minor changes to the positions of the Raman bands and a decrease of their intensity ratio down to 1.7.…”
Section: Resultsmentioning
confidence: 95%
“…As shown in Figure , the first treatment induced no relevant change to the G, 2D Raman bands apart from a small decrease of their intensity ratio from 2.8 down to 2.0. The successive vacuum treatment up to 18.5 h gives a blue shift of the two bands, some further reduction of their intensity ratio and the appearance of a large unresolved signal below the G band that can be associated to some amorphous carbon contribution arising from residual PMMA carbonization . The treatment of a sample in CO 2 atmosphere gives again minor changes to the positions of the Raman bands and a decrease of their intensity ratio down to 1.7.…”
Section: Resultsmentioning
confidence: 95%
“…The coating process is described in detail elsewhere [5,20,21], but here only briefly: Sample holders were placed 275 mm in front of the plasma source. This direct alignment results in so-called r-type diamond-like carbon (DLC) coatings [20][21][22][23]. An initial oxygen plasma (10 min, 200 W, 1 Pa, 65 sccm/min) cleaned and activated the PHB surface for further coating.…”
Section: Sample Preparation and Film Depositionmentioning
confidence: 99%
“…In a previous study of a‐C:H on silicon (100), these grains were also detected for the 500 nm sample. The presence of grains is indicative for a homogenous carbon growth on these samples (Figure b,c) . The surface morphologies of a‐C:H@Si (Figure b) and Ru@a‐C:H@Si (Figure c) appear identical at the AFM analysis, which supports a small amount of attached Ru‐complex 5 without changing the main morphology.…”
Section: Resultsmentioning
confidence: 59%
“…This noticeable difference may be due to slightly different plasma species composition during the industrial deposition process. The increased roughness values found between raw silicon material and deposited samples (Table ) is related to the presence of grains during deposition that act as bumps corrugating the surface profiles …”
Section: Resultsmentioning
confidence: 99%
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