2012
DOI: 10.1063/1.4745858
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Characteristics of gate-all-around silicon nanowire field effect transistors with asymmetric channel width and source/drain doping concentration

Abstract: Articles you may be interested inStatistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire fieldeffect transistors Appl.

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Cited by 5 publications
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“…15) For conventional and junctionless nanowire FETs, technical computer-aided design (TCAD) simulations using thermionic diffusion transport have shown that the asymmetric gate controllability of the source and drain junctions largely affect the device performance. 16,17) Depending on the channel thickness of the source or drain side, the on=off-current and subthreshold swing can be enhanced or degraded in the nanowire FETs. Thus, studying asymmetric channel thickness in the TFET using the BTBT tunneling transport is critical for the design of the TFETs for various applications.…”
Section: Introductionmentioning
confidence: 99%
“…15) For conventional and junctionless nanowire FETs, technical computer-aided design (TCAD) simulations using thermionic diffusion transport have shown that the asymmetric gate controllability of the source and drain junctions largely affect the device performance. 16,17) Depending on the channel thickness of the source or drain side, the on=off-current and subthreshold swing can be enhanced or degraded in the nanowire FETs. Thus, studying asymmetric channel thickness in the TFET using the BTBT tunneling transport is critical for the design of the TFETs for various applications.…”
Section: Introductionmentioning
confidence: 99%