2021
DOI: 10.1016/j.jmrt.2021.11.089
|View full text |Cite
|
Sign up to set email alerts
|

Characteristics of dynamic softening during high temperature deformation of CoCrFeMnNi high-entropy alloy and its correlation with the evolving microstructure and micro-texture

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
16
1

Year Published

2022
2022
2024
2024

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 24 publications
(18 citation statements)
references
References 30 publications
1
16
1
Order By: Relevance
“…The microstructure of the specimens was examined using a Zeiss ULTRAplus field emission scanning electron microscope equipped for both elemental analysis (Oxford Instruments X-Max N 80 energy dispersive X-ray spectroscope (EDS)) and crystallographic analysis (Oxford Instruments' Symmetry® electron backscatter diffraction (EBSD) detector). The hot deformed specimens were segmented along the mid-plane parallel to the compression axis, as also explained in author's previous work [33]. The samples were first rough-polished using successive abrasive SiC papers, and in the final stages, fine-polished with 3 and 1 µm diamond suspensions.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…The microstructure of the specimens was examined using a Zeiss ULTRAplus field emission scanning electron microscope equipped for both elemental analysis (Oxford Instruments X-Max N 80 energy dispersive X-ray spectroscope (EDS)) and crystallographic analysis (Oxford Instruments' Symmetry® electron backscatter diffraction (EBSD) detector). The hot deformed specimens were segmented along the mid-plane parallel to the compression axis, as also explained in author's previous work [33]. The samples were first rough-polished using successive abrasive SiC papers, and in the final stages, fine-polished with 3 and 1 µm diamond suspensions.…”
Section: Methodsmentioning
confidence: 99%
“…Furthermore, the fully recrystallized, partially deformed, and deformed grains were identified using the grain average misorientation (GAM) maps. The GAM maps were constructed using the EBSD data according to the criteria explained in previous work [33]. A PANalytic Empyrean Multipurpose Diffractometer (Malvern Panalytical Ltd, Netherlands) X-ray diffraction (XRD) instrument was used to examine the crystallographic structure of the hot-rolled sample, operated on a Cu-K α radiation source at 45 kV and 40 mA conditions.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The GAM criteria indicate the degree of orientation uniformity within each grain. The misorientation interval was from 0 • to 5 • , which is the basis for the grains' state, determination and fraction of their evaluation [11][12][13].…”
Section: Methodsmentioning
confidence: 99%
“…Influence of Temperature on Residual Stresses KAM can be used to illustrate the overall defect density [43] and reflect the strain distribution in the microstructure. [44] Thus, it can be employed to observe the state of residual stresses within the specimen. Figure 15a depicts the KAM map of the as-extruded 7005 Al alloy before compression.…”
Section: Deformation Mechanismsmentioning
confidence: 99%