2006
DOI: 10.1016/j.nimb.2006.03.047
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Characteristics of Al doped zinc oxide (ZAO) thin films deposited by RF magnetron sputtering

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Cited by 20 publications
(8 citation statements)
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“…3) appears at a binding energy of 1022.7 eV which is in close agreement with reported values for the binding energy of zinc in the Zn +2 oxidation state [34,35]. Moreover, the binding energy difference between Zn2p3/2 and Zn2p1/2 signals is 23.5 eV which is a characteristic value of ZnO [36].…”
Section: Characterization Of Zinc Oxide Thin Filmssupporting
confidence: 88%
“…3) appears at a binding energy of 1022.7 eV which is in close agreement with reported values for the binding energy of zinc in the Zn +2 oxidation state [34,35]. Moreover, the binding energy difference between Zn2p3/2 and Zn2p1/2 signals is 23.5 eV which is a characteristic value of ZnO [36].…”
Section: Characterization Of Zinc Oxide Thin Filmssupporting
confidence: 88%
“…They all show conductivity and transparency in the same range like ITO, but they are much cheaper [224]. Other problems like stability and surface adherence and surface roughness vary strongly for the different oxides and have to be optimised [225,226,236].…”
Section: Other Tco Systemsmentioning
confidence: 99%
“…As a result, ZnO-based transparent conductive film is expected to be a substitute for ITO film. 7,8 Doping Al, Ga, Sn, Ti, Nb and other elements in ZnO materials has become a hot research topic in the field of transparent conductive films. [9][10][11] Among these doping elements, Nb has great potential because the ionic radius of Nb 5þ is 0.64 Å, which is slightly smaller than the ionic radius of Zn 2þ (0.74 Å), 12 revealing theoretically there is a possibility of replacing Zn 2þ with Nb 5þ .…”
Section: Introductionmentioning
confidence: 99%