1990
DOI: 10.1109/22.60024
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Characteristic impedance and electromagnetic field distribution in metal-insulator-semiconductor microstrip

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Cited by 6 publications
(5 citation statements)
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“…Approximate measured values of Z,, are obtained from the error boxes relating the TRL calibration reference impedance (equal to ZMs) to a known (SO-a) calibration impedance [7, 81. The computed data for Z,, are obtained from [6]. Good agreement between theory and measurement is observed for each entity.…”
Section: Resultsmentioning
confidence: 86%
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“…Approximate measured values of Z,, are obtained from the error boxes relating the TRL calibration reference impedance (equal to ZMs) to a known (SO-a) calibration impedance [7, 81. The computed data for Z,, are obtained from [6]. Good agreement between theory and measurement is observed for each entity.…”
Section: Resultsmentioning
confidence: 86%
“…Here, the imaginary part of Z,, = Z,, is large compared to the real part. As the operating frequency increases, the effect of this term diminishes because the imaginary part of Z,, substantially decreases [6]. Closer examination of Figure 3 indicates that roughly 50% of the power incident upon the step discontinuity is dissipated in the device; this might seem excessive.…”
Section: Resultsmentioning
confidence: 98%
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“…If only perfect conducting scatterers are assumed, no equivalent magnetic currents are present, and only the evaluation of , and is necessary. In this case, an electric-field integral equation can be formulated: (29) where is the surface electric current on the metallic objects, is the contour of the cross section of the metallic objects inside one spatial period (a "unit cell"), and is any point on . A spatial-domain MoM approach is used to discretize the relevant integral equations.…”
Section: B Results For Plane Waves Impinging On Periodic Structuresmentioning
confidence: 99%
“…Nevertheless, thin layers can be present in specific applications such as the microstrip studied in [28] and [29], having a thin insulator on the top of the grounded dielectric slab, or bounding sheets for multilayered structures as in [30]. If the source layer is adjacent to a very thin layer, then the extraction method discussed here loses benefit, since the correct reflection from the thin layer is not well modelled by reflection from a single interface unless the wavenumber is very large.…”
mentioning
confidence: 91%