Analysis of a microstrip step discontinuity fabricated on a metal‐insulator‐semiconductor (MIS) substrate

Livernols, Thomas G.; East, J.R.

doi:10.1002/mop.4650051303

Micro & Optical Tech Letters

1992

DOI: 10.1002/mop.4650051303

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Analysis of a microstrip step discontinuity fabricated on a metal‐insulator‐semiconductor (MIS) substrate

Thomas G. Livernols

J.R. East

Abstract: A space‐domain coupled integral equation analysis is used to compute the two‐dimensional surface current distribution on a basic microstrip step discontinuity fabricated on an MIS substrate. The two‐port scattering parameters are computed from the surface current and their accuracy is verified through comparison with a measured data. © 1992 John Wiley & Sons, Inc.

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Cited by 4 publications

References 17 publications

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Reciprocity normalized matrix representation of quasi-TEM multimode multiports

Seguinot¹,

Paleczny²,

Kennis³

et al. 1999

Microw. Opt. Technol. Lett.

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Generalized scattering parameters and the impedance matrix of multimode quasi‐TEM networks are related using a normalization impedance matrix. The corresponding formula appears to be an extension of the usual single‐mode multiports ones. Theoretical and measured parameters are compared for a multimode one‐port and an asymmetrical coupled‐strip four‐port. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 214–218, 1999.

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Reciprocity normalized matrix representation of quasi-TEM multimode multiports

Seguinot¹,

Paleczny²,

Kennis³

et al. 1999

Microw. Opt. Technol. Lett.

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show abstract

A simple reciprocity normalization procedure for the derivation of scattering parameters using electromagnetic simulators

Seguinot

Huret

Paleczny

et al. 1999

Microw. Opt. Technol. Lett.

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We report a simple and helpful procedure which yields the derivation of reciprocity normalized scattering parameters without the need for field normalization. The algorithm can be easily implemented in any electromagnetic simulator to reduce the CPU time and memory requirements. Two examples involving a lossy single‐mode two‐port and a multimode network are presented. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 21: 69–72, 1999.

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Characterization of dissipative losses in microwave circuits

Livernois

1994

Micro & Optical Tech Letters

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Analysis of a microstrip step discontinuity fabricated on a metal‐insulator‐semiconductor (MIS) substrate

Cited by 4 publications

References 17 publications

Reciprocity normalized matrix representation of quasi-TEM multimode multiports

Reciprocity normalized matrix representation of quasi-TEM multimode multiports

A simple reciprocity normalization procedure for the derivation of scattering parameters using electromagnetic simulators

Characterization of dissipative losses in microwave circuits

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